| 000 | 03095nla2a2200457 4500 | ||
|---|---|---|---|
| 001 | 644954 | ||
| 005 | 20231030040636.0 | ||
| 035 | _a(RuTPU)RU\TPU\network\10038 | ||
| 035 | _aRU\TPU\network\10037 | ||
| 090 | _a644954 | ||
| 100 | _a20151207a2015 k y0engy50 ba | ||
| 101 | 0 | _aeng | |
| 105 | _ay z 100zy | ||
| 135 | _adrgn ---uucaa | ||
| 181 | 0 | _ai | |
| 182 | 0 | _ab | |
| 200 | 1 |
_aDistribution Functions for Internal Interface Energy as a Characteristic of Submicrocrystalline Copper Structure Evolution under Low-Temperature Annealing _fP. V. Kuznetsov [et al.] |
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| 203 |
_aText _celectronic |
||
| 300 | _aTitle screen | ||
| 320 | _a[References: 6 tit.] | ||
| 330 | _aSubmicrocrystalline structure of 99.99% pure copper produced by equal channel angular pressing was under investigation. After deformation the samples were subjected to low-temperature annealing. Grain and subgrain structure was studied by scanning tunnel microscopy. Internal interface energy was estimated using the method based on measurement of dihedral angles (psi) of the boundary grooves formed by electrochemical etching. Analysis of the differential and cumulative distribution functions for relative grain boundary energy enabled to qualitatively evaluate energy redistribution between the boundaries of different types and internal bulk crystallites and to study evolution of submicrocrystalline structure under low-temperature annealing. | ||
| 333 | _aРежим доступа: по договору с организацией-держателем ресурса | ||
| 461 | 0 |
_0(RuTPU)RU\TPU\network\4816 _tAIP Conference Proceedings |
|
| 463 | 0 |
_0(RuTPU)RU\TPU\network\9779 _tVol. 1683 : Advanced Materials with Hierarchical Structure for New Technologies and Reliable Structures _oProceedings of the International Conference, 21–25 September 2015, Tomsk, Russia _fNational Research Tomsk Polytechnic University (TPU) ; ed. V. E. Panin ; S. G. Psakhie ; V. M. Fomin _v[020117, 5 p.] _d2015 |
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| 610 | 1 | _aэлектронный ресурс | |
| 610 | 1 | _aтруды учёных ТПУ | |
| 610 | 1 | _aфункции распределения | |
| 610 | 1 | _aинтерфейсы | |
| 610 | 1 | _aэнергия | |
| 610 | 1 | _aструктуры | |
| 610 | 1 | _aотжиг | |
| 610 | 1 | _aсканирующая туннельная микроскопия | |
| 610 | 1 | _aкристаллиты | |
| 701 | 1 |
_aKuznetsov _bP. V. _cphysicist _cAssociate Professor of Tomsk Polytechnic University, Candidate of physical and mathematical sciences _f1952- _gPavel Viktorovich _2stltpush _3(RuTPU)RU\TPU\pers\34499 |
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| 701 | 1 |
_aRakhmatulina _bT. |
|
| 701 | 1 |
_aKoznikov _bA. |
|
| 701 | 1 |
_aBelyaeva _bI. |
|
| 712 | 0 | 2 |
_aНациональный исследовательский Томский политехнический университет (ТПУ) _bФизико-технический институт (ФТИ) _bКафедра общей физики (ОФ) _h136 _2stltpush _3(RuTPU)RU\TPU\col\18734 |
| 801 | 2 |
_aRU _b63413507 _c20151207 _gRCR |
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| 856 | 4 | _uhttp://dx.doi.org/10.1063/1.4932807 | |
| 942 | _cCF | ||