000 02832nla2a2200457 4500
001 644993
005 20231030040637.0
035 _a(RuTPU)RU\TPU\network\10077
035 _aRU\TPU\network\10076
090 _a644993
100 _a20151207a2015 k y0engy50 ba
101 0 _aeng
105 _ay z 100zy
135 _adrgn ---uucaa
181 0 _ai
182 0 _ab
200 1 _aRole of Crystallographic Anisotropy in the Formation of Surface Layers of Single NiTi Crystals after Ion-Plasma Alloying
_fT. M. Poletika [et al.]
203 _aText
_celectronic
300 _aTitle screen
320 _a[References: 7 tit.]
330 _aThe structure of the surface and near-surface layers of single crystals of NiTi, differently oriented relative to the direction of ion beam treatment was investigated. The role of the crystallographic orientation in formation of structure of surface layers after ion-plasma alloying was revealed. It was found that the orientation effects of selective sputtering and channeling determine the thickness of the oxide and amorphous layers, the depth of penetration of ions and impurities, the distribution of Ni with depth.
333 _aРежим доступа: по договору с организацией-держателем ресурса
461 0 _0(RuTPU)RU\TPU\network\4816
_tAIP Conference Proceedings
463 0 _0(RuTPU)RU\TPU\network\9779
_tVol. 1683 : Advanced Materials with Hierarchical Structure for New Technologies and Reliable Structures
_oProceedings of the International Conference, 21–25 September 2015, Tomsk, Russia
_fNational Research Tomsk Polytechnic University (TPU) ; ed. V. E. Panin ; S. G. Psakhie ; V. M. Fomin
_v[020184, 4 p.]
_d2015
610 1 _aэлектронный ресурс
610 1 _aтруды учёных ТПУ
610 1 _aанизотропия
610 1 _aповерхностные слои
610 1 _aкристаллы
610 1 _aлегирование
610 1 _aмонокристаллы
610 1 _aионные пучки
701 1 _aPoletika
_bT. M.
701 1 _aMeisner
_bL. L.
701 1 _aGirsova
_bS. L.
701 1 _aMeisner
_bS. N.
701 1 _aShulepov
_bI. A.
_cphysicist
_cEngineer-designer of Tomsk Polytechnic University, Candidate of physical and mathematical sciences
_f1954-
_gIvan Anisimovich
_2stltpush
_3(RuTPU)RU\TPU\pers\33092
712 0 2 _aНациональный исследовательский Томский политехнический университет (ТПУ)
_bФизико-технический институт (ФТИ)
_bЦентр измерений свойств материалов (ЦИСМ)
_h6684
_2stltpush
_3(RuTPU)RU\TPU\col\19361
801 2 _aRU
_b63413507
_c20151207
_gRCR
856 4 _uhttp://dx.doi.org/10.1063/1.4932874
942 _cCF