000 | 03137nlm0a2200373 4500 | ||
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001 | 646220 | ||
005 | 20231030040720.0 | ||
035 | _a(RuTPU)RU\TPU\network\11354 | ||
035 | _aRU\TPU\network\7231 | ||
090 | _a646220 | ||
100 | _a20160217d2015 k y0engy50 ba | ||
101 | 0 | _aeng | |
102 | _aCZ | ||
105 | _aa z 100zy | ||
135 | _adrcn ---uucaa | ||
181 | 0 | _ai | |
182 | 0 | _ab | |
200 | 1 |
_aFluxgate magnetometer for measuring ultra low magnetic induction _fV. E. Baranova, P. F. Baranov, S. V. Muravyov (Murav’ev), S. V. Uchaykin (Uchaikin) |
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203 |
_aText _celectronic |
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300 | _aTitle screen | ||
320 | _a[References: 20 tit.] | ||
330 | _aThe paper describes an experience in developing one-component magnetometer based on a miniature planar fluxgate sensor for measuring ultra low magnetic induction and operating at extremely low temperatures. A fluxgate magnetic sensor was fabricated in PCB technology with geometric dimensions 10×6×2 mm. The linearity error of the developed magnetometer is about 1.9 % of full scale and its maximum sensitivity is about 99 V/mT. | ||
463 |
_tMeasurement in Research and Industry _oProceedings of the XXI IMEKO World Congress, August 30 − September 4, 2015, Prague, Czech Republic _v[4 р.] _d2015 |
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610 | 1 | _aэлектронный ресурс | |
610 | 1 | _aтруды учёных ТПУ | |
701 | 1 |
_aBaranova _bV. E. _cspecialist in the field of control and measurement equipment _csenior lecturer of Tomsk Polytechnic University, Engineer _f1986- _gVitaliya Evgenyevna _2stltpush _3(RuTPU)RU\TPU\pers\35637 |
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701 | 1 |
_aBaranov _bP. F. _cspecialist in the field of control and measurement equipment _cAssociate Professor of Tomsk Polytechnic University, Candidate of technical sciences _f1987- _gPavel Fedorovich _2stltpush _3(RuTPU)RU\TPU\pers\34618 |
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701 | 1 |
_aMuravyov (Murav’ev) _bS. V. _cspecialist in the field of control and measurement equipment _cProfessor of Tomsk Polytechnic University,Doctor of technical sciences _f1954- _gSergey Vasilyevich _2stltpush _3(RuTPU)RU\TPU\pers\31262 |
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701 | 1 |
_aUchaykin (Uchaikin) _bS. V. _cspecialist in the field of non-destructive testing _cEngineer of Tomsk Polytechnic University, Doctor of physical and mathematical sciences _f1963- _gSergey Victorovich _2stltpush _3(RuTPU)RU\TPU\pers\32279 |
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712 | 0 | 2 |
_aНациональный исследовательский Томский политехнический университет (ТПУ) _bИнститут кибернетики (ИК) _bКафедра компьютерных измерительных систем и метрологии (КИСМ) _h66 _2stltpush _3(RuTPU)RU\TPU\col\18706 |
712 | 0 | 2 |
_aНациональный исследовательский Томский политехнический университет (ТПУ) _bИнститут неразрушающего контроля (ИНК) _bКафедра точного приборостроения (ТПС) _h63 _2stltpush _3(RuTPU)RU\TPU\col\18717 |
801 | 2 |
_aRU _b63413507 _c20211224 _gRCR |
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856 | 4 | _uhttps://www.imeko.org/publications/wc-2015/IMEKO-WC-2015-TC4-103.pdf | |
942 | _cCF |