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001 646592
005 20231030040734.0
035 _a(RuTPU)RU\TPU\network\11728
035 _aRU\TPU\network\11717
090 _a646592
100 _a20160304a2016 k y0engy50 ba
101 0 _aeng
105 _ay z 100zy
135 _adrcn ---uucaa
181 0 _ai
182 0 _ab
200 1 _aStructure and Properties of a Titanium Film – Aluminum Substrate System Alloyed by an Intense Pulsed Electron Beam
_fO. Krysina [et al.]
203 _aText
_celectronic
225 1 _aPhysicochemical Properties of Materials and Current Processing Technologies
300 _aTitle screen
330 _aThe structure and properties of a Ti film – Al substrate system alloyed by an intense pulsed electron beam are studied. It is shown that electron beam melting of this system provides the formation of a multiphase submicrocrystalline structure with high strength and tribological properties in the surface layer. Irradiation modes, which allow an increase in the microhardness of the material and a decrease in its wear rate, are defined. Physical substantiation of this phenomenon is given.
333 _aРежим доступа: по договору с организацией-держателем ресурса
461 0 _0(RuTPU)RU\TPU\network\11477
_tKey Engineering Materials
_oScientific Journal
463 0 _0(RuTPU)RU\TPU\network\11495
_tVol. 683 : Multifunctional Materials: Development and Application
_oThe XII International Conference "Prospects of Fundamental Sciences Development" (PFSD-2015), April 21-24, 2015, Tomsk, Russia
_o[proceedings]
_fNational Research Tomsk Polytechnic University (TPU) ; eds. I. A. Kurzina, A. Yu. Godymchuk (Godimchuk)
_v[P. 9-14]
_d2016
610 1 _aэлектронный ресурс
610 1 _aтруды учёных ТПУ
610 1 _aалюминий
610 1 _aпленки
610 1 _aподложки
610 1 _aсвойства
610 1 _aимпульсные пучки
610 1 _aэлектронные пучки
610 1 _aструктура
610 1 _aтитан
701 1 _aKrysina
_bO.
701 1 _aRygina
_bM.
_gMaria
701 1 _aPetrikova
_bE.
701 1 _aTeresov
_bA. D.
701 1 _aIvanov
_bY.
712 0 2 _aНациональный исследовательский Томский политехнический университет (ТПУ)
_c(2009- )
_2stltpush
_3(RuTPU)RU\TPU\col\15902
801 2 _aRU
_b63413507
_c20160304
_gRCR
856 4 _uhttp://dx.doi.org/10.4028/www.scientific.net/KEM.683.9
942 _cCF