| 000 | 03341nlm1a2200361 4500 | ||
|---|---|---|---|
| 001 | 646824 | ||
| 005 | 20231030040741.0 | ||
| 035 | _a(RuTPU)RU\TPU\network\11961 | ||
| 090 | _a646824 | ||
| 100 | _a20160317a2016 k y0engy50 ba | ||
| 101 | 0 | _aeng | |
| 135 | _adrcn ---uucaa | ||
| 181 | 0 | _ai | |
| 182 | 0 | _ab | |
| 200 | 1 |
_aRadial distribution of radiation in a CuBr vapor brightness amplifier used in laser monitors _fF. A. Gubarev [et al.] |
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| 203 |
_aText _celectronic |
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| 300 | _aTitle screen | ||
| 320 | _a[References: 39 tit.] | ||
| 330 | _aThe paper presents a study of the effect of excitation conditions in a CuBr vapor brightness amplifier in a monostatic laser monitor on the radial non-uniformity of the radiation bearing the information about the object being visualized. A significant dependence of radial signal distribution on the concentrations of CuBr, HBr and pumping power has been demonstrated. In particular, an increase in CuBr vapor concentration causes the gain profile of the active medium to constrict and the axial gain to increase. The conditions for the most uniform radial distribution of the laser monitor signal are substantially different from those for the maximum radiated power. The paper demonstrates HBr doping to be usable as a tool to correct the non-uniformity of the radial distribution of laser monitor radiation. An addition of ~0.15 Torr HBr broadens and flattens the radiation profile, improving an important aspect of laser monitor image quality. | ||
| 333 | _aРежим доступа: по договору с организацией-держателем ресурса | ||
| 461 |
_tApplied Physics B _oLasers and Optics |
||
| 463 |
_tVol. 122, iss. 1 _v[2, 7 p.] _d2016 |
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| 610 | 1 | _aэлектронный ресурс | |
| 610 | 1 | _aтруды учёных ТПУ | |
| 701 | 1 |
_aGubarev _bF. A. _cspecialist in the field of electronics _cAssociate Professor of Tomsk Polytechnic University, Candidate of physical and mathematical sciences _f1979- _gFedor Aleksandrovich _2stltpush _3(RuTPU)RU\TPU\pers\31657 |
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| 701 | 1 |
_aTrigub _bM. V. _cspecialist in the field of non-destructive testing _cAssociate Professor of Tomsk Polytechnic University, Candidate of technical sciences _f1987- _gMaksim Viktorovich _2stltpush _3(RuTPU)RU\TPU\pers\31242 |
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| 701 | 1 |
_aKlenovskii (Klenovsky) _bM. S. _cspecialist in the field of electronics _cJunior research fellow Tomsk Polytechnic University _f1984- _gMiron Stanislavovich _2stltpush _3(RuTPU)RU\TPU\pers\36126 |
|
| 701 | 0 |
_aLi Lin _cspecialist in the field of electronics _cresearch engineer at Tomsk Polytechnic University _f1990- _2stltpush _3(RuTPU)RU\TPU\pers\36367 |
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| 701 | 1 |
_aEvtushenko _bG. S. _cDoctor of Technical Sciences, Professor of Tomsk Polytechnic University (TPU) _cRussian specialist in electrophysics _f1947- _gGennady Sergeevich _2stltpush _3(RuTPU)RU\TPU\pers\29009 |
|
| 712 | 0 | 2 |
_aНациональный исследовательский Томский политехнический университет (ТПУ) _bИнститут неразрушающего контроля (ИНК) _bКафедра промышленной и медицинской электроники (ПМЭ) _h64 _2stltpush _3(RuTPU)RU\TPU\col\18719 |
| 801 | 2 |
_aRU _b63413507 _c20170206 _gRCR |
|
| 856 | 4 | _uhttp://dx.doi.org/10.1007/s00340-015-6288-5 | |
| 942 | _cCF | ||