000 | 03289nla2a2200457 4500 | ||
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001 | 647131 | ||
005 | 20231030040751.0 | ||
035 | _a(RuTPU)RU\TPU\network\12269 | ||
035 | _aRU\TPU\network\12254 | ||
090 | _a647131 | ||
100 | _a20160328a2016 k y0engy50 ba | ||
101 | 0 | _aeng | |
105 | _ay z 100zy | ||
135 | _adrcn ---uucaa | ||
181 | 0 | _ai | |
182 | 0 | _ab | |
200 | 1 |
_aResearch of the Additional Losses Occurring in Optical Fiber at its Multiple Bends in the Range Waves 1310nm, 1550nm and 1625nm Long _fA. V. Yurchenko, N. I. Gorlov, A. D. Alkina [et al.] |
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203 |
_aText _celectronic |
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300 | _aTitle screen | ||
320 | _a[References: 5 tit.] | ||
330 | _aArticle is devoted to research of the additional losses occurring in the optical fiber at its multiple bends in the range waves of 1310 nanometers, 1550 nanometers and 1625 nanometers long. Article is directed on creation of the external factors methods which allow to estimate and eliminate negative influence. The automated way of calculation of losses at a bend is developed. Results of scientific researches are used by engineers of "Kazaktelekom" AS for practical definition of losses service conditions. For modeling the Wolfram|Alpha environment - the knowledge base and a set of computing algorithms was chosen. The greatest losses are noted on wavelength 1310nm and 1625nm. All dependences are nonlinear. Losses with each following excess are multiplicative. | ||
333 | _aРежим доступа: по договору с организацией-держателем ресурса | ||
461 | 0 |
_0(RuTPU)RU\TPU\network\3526 _tJournal of Physics: Conference Series |
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463 | 0 |
_0(RuTPU)RU\TPU\network\12214 _tVol. 671 : Innovations in Non-Destructive Testing (SibTest 2015) _oIII All-Russian Scientific and Practical Conference, 27–31 July 2015, Altai, Russia _o[proceedings] _fNational Research Tomsk Polytechnic University (TPU) _v[012001, 6 p.] _d2016 |
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610 | 1 | _aэлектронный ресурс | |
610 | 1 | _aтруды учёных ТПУ | |
610 | 1 | _aпотери | |
610 | 1 | _aоптические волокна | |
610 | 1 | _aизгибы | |
610 | 1 | _aвычислительные алгоритмы | |
610 | 1 | _aволны | |
701 | 1 |
_aYurchenko _bA. V. _cphysicist _cProfessor of Tomsk Polytechnic University, candidate of technical sciences _f1974- _gAleksey Vasilievich _2stltpush _3(RuTPU)RU\TPU\pers\35053 |
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701 | 1 |
_aGorlov _bN. I. |
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701 | 1 |
_aAlkina _bA. D. |
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701 | 1 |
_aMekhtiyev (Mekhtiev) _bA. _cSpecialist in the field of electronics _cSenior researcher of Tomsk Polytechnic University, Candidate of technical sciences _f1972- _gAli _2stltpush _3(RuTPU)RU\TPU\pers\39786 |
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701 | 1 |
_aKovtun _bA. A. |
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712 | 0 | 2 |
_aНациональный исследовательский Томский политехнический университет (ТПУ) _bИнститут неразрушающего контроля (ИНК) _bКафедра физических методов и приборов контроля качества (ФМПК) _h68 _2stltpush _3(RuTPU)RU\TPU\col\18709 |
801 | 2 |
_aRU _b63413507 _c20200716 _gRCR |
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856 | 4 | _uhttp://dx.doi.org/10.1088/1742-6596/671/1/012001 | |
856 | 4 | _uhttp://earchive.tpu.ru/handle/11683/33722 | |
942 | _cCF |