000 03071nla2a2200481 4500
001 647134
005 20231030040751.0
035 _a(RuTPU)RU\TPU\network\12272
035 _aRU\TPU\network\12271
090 _a647134
100 _a20160328a2016 k y0engy50 ba
101 0 _aeng
105 _ay z 100zy
135 _adrcn ---uucaa
181 0 _ai
182 0 _ab
200 1 _aThree-axis MEMS Accelerometer for Structural Inspection
_fE. S. Barbin [et al.]
203 _aText
_celectronic
300 _aTitle screen
320 _a[References: 6 tit.]
330 _aMicroelectromechanical system accelerometers are widely used for metrological measurements of acceleration, tilt, vibration, and shock in moving objects. The paper presents the analysis of MEMS accelerometer that can be used for the structural inspection. ANSYS Multiphysics platform is used to simulate the behavior of MEMS accelerometer by employing a finite element model and MATLAB/Simulink tools for modeling nonlinear dynamic systems.
333 _aРежим доступа: по договору с организацией-держателем ресурса
461 0 _0(RuTPU)RU\TPU\network\3526
_tJournal of Physics: Conference Series
463 0 _0(RuTPU)RU\TPU\network\12214
_tVol. 671 : Innovations in Non-Destructive Testing (SibTest 2015)
_oIII All-Russian Scientific and Practical Conference, 27–31 July 2015, Altai, Russia
_o[proceedings]
_fNational Research Tomsk Polytechnic University (TPU)
_v[012003, 6 p.]
_d2016
610 1 _aэлектронный ресурс
610 1 _aтруды учёных ТПУ
610 1 _aакселерометры
610 1 _aANSYS
610 1 _aповедение
610 1 _aконечно-элементные модели
610 1 _aMatLab
610 1 _aSimulink
610 1 _aнелинейные системы
610 1 _aдинамические системы
701 1 _aBarbin
_bE. S.
_cspecialist in the field of instrument engineering
_cengineer of Tomsk Polytechnic University
_f1988-
_gEvgeny Sergeevich
_2stltpush
_3(RuTPU)RU\TPU\pers\36470
701 1 _aKoleda
_bA. N.
_cSpecialist in the field of instrument making
_cEngineer of Tomsk Polytechnic University
_f1985-
_gAleksey Nikolaevich
_2stltpush
_3(RuTPU)RU\TPU\pers\33286
701 1 _aNesterenko
_bT. G.
_cspecialist in the field of mechanical engineering
_cAssociate Professor of Tomsk Polytechnic University, Candidate of technical sciences
_f1946-
_gTamara Georgievna
_2stltpush
_3(RuTPU)RU\TPU\pers\30970
701 1 _aVtorushin
_bS.
712 0 2 _aНациональный исследовательский Томский политехнический университет (ТПУ)
_bИнститут неразрушающего контроля (ИНК)
_bКафедра точного приборостроения (ТПС)
_h63
_2stltpush
_3(RuTPU)RU\TPU\col\18717
801 2 _aRU
_b63413507
_c20161125
_gRCR
856 4 _uhttp://dx.doi.org/10.1088/1742-6596/671/1/012003
856 4 _uhttp://earchive.tpu.ru/handle/11683/33744
942 _cCF