| 000 | 04210nlm0a2200433 4500 | ||
|---|---|---|---|
| 001 | 647286 | ||
| 005 | 20231030040756.0 | ||
| 035 | _a(RuTPU)RU\TPU\network\12424 | ||
| 090 | _a647286 | ||
| 100 | _a20160401a2012 k y0engy50 ba | ||
| 101 | 0 | _aeng | |
| 102 | _aCZ | ||
| 105 | _ay z 100zy | ||
| 135 | _adrnn ---uucaa | ||
| 181 | 0 | _ai | |
| 182 | 0 | _ab | |
| 200 | 1 |
_aModelling the Pattern of Acoustic Array for Pulse Mode _fI. O. Bolotina [et al.] |
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| 203 |
_aText _celectronic |
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| 300 | _aTitle screen | ||
| 320 | _a[References: p. 19 (3 tit.)] | ||
| 330 | _aThe problem of analytical determination of the pattern of complex acoustic array for pulse mode is an extremely difficult task. If to take into consideration the existing in practice form of probe influence which, as a rule, does not undergo analytical description then the task becomes practically impossible to complete. However to solve many problems of nondestructive testing it is necessary to determine and analyze the pattern of multi-element acoustic array for pulse mode. The method of numerical simulation of a linear equidistant antenna array with information processing by the algorithm SAFT, which enables the calculation of the radiation pattern of antenna array operating in pulse mode, is proposed in the paper. Results presented in the article include discussion of the simulation results and experimental studies that illustrate the spatial parameters of the pattern and characterize the possibility of quantifying the size of defects, also they allow to make the conclusion about high efficiency of the method suggested. | ||
| 463 |
_tNDE for Safety / Defektoskopie 2012 _oProceedings sbornik prispevku of 42 International Conference and NDT Exibition, Praha, 30 October-1 November 2012 _v[P. 13-19] _d2012 |
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| 610 | 1 | _aэлектронный ресурс | |
| 610 | 1 | _aтруды учёных ТПУ | |
| 610 | 1 | _aдиаграмма направленности | |
| 610 | 1 | _aизлучение | |
| 610 | 1 | _aбоковые лепестки | |
| 610 | 1 | _aчисленное моделирование | |
| 701 | 1 |
_aBolotina _bI. O. _cspecialist in the field of industrial and medical electronics _cAssociate Professor of Tomsk Polytechnic University, Candidate of chemical sciences _f1974- _gIrina Olegovna _2stltpush _3(RuTPU)RU\TPU\pers\34516 |
|
| 701 | 1 |
_aKvasnikov _bK. G. _cspecialist in the field of informatics and computer technology _cHead of Informatization of Tomsk Polytechnic University _f1968- _gKonstantin Grigorievich _2stltpush _3(RuTPU)RU\TPU\pers\34515 |
|
| 701 | 1 |
_aKroening _bH. M. V. A. _cspecialist in the field of non-destructive testing _cleading researcher of Tomsk Polytechnic University _gHans Michael Wilhelm Adolf _2stltpush _3(RuTPU)RU\TPU\pers\36306 |
|
| 701 | 1 |
_aМакаров _bВ. С. _cспециалист в области неразрушающего контроля _cинженер Томского политехнического университета _f1948- _gВиктор Степанович _2stltpush _3(RuTPU)RU\TPU\pers\27848 |
|
| 701 | 1 |
_aSoldatov _bA. I. _cspecialist in the field of electronics _cProfessor of Tomsk Polytechnic University, doctor of technical Sciences _f1958- _gAleksey Ivanovich _2stltpush _3(RuTPU)RU\TPU\pers\31243 |
|
| 701 | 1 |
_aSoldatov _bA. A. _cspecialist in the field of electronics _cengineer, senior teacher Tomsk Polytechnic University, candidate of technical Sciences _f1988- _gAndrey Alekseevich _2stltpush _3(RuTPU)RU\TPU\pers\35417 |
|
| 701 | 1 |
_aSorokin _bP. V. _cspecialist in the field of electronics _cAssociate Professor of Tomsk Polytechnic University, engineer, candidate of technical sciences _f1960- _gPavel Vladimirovich _2stltpush _3(RuTPU)RU\TPU\pers\35313 |
|
| 712 | 0 | 2 |
_aНациональный исследовательский Томский политехнический университет (ТПУ) _bИнститут неразрушающего контроля (ИНК) _bКафедра промышленной и медицинской электроники (ПМЭ) _h64 _2stltpush _3(RuTPU)RU\TPU\col\18719 |
| 801 | 2 |
_aRU _b63413507 _c20160401 _gRCR |
|
| 856 | 4 | _uhttp://www.ndt.net/article/defektoskopie2012/papers/13_p.pdf | |
| 942 | _cCF | ||