000 | 02256nlm1a2200385 4500 | ||
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001 | 648450 | ||
005 | 20231030040837.0 | ||
035 | _a(RuTPU)RU\TPU\network\13607 | ||
035 | _aRU\TPU\network\13606 | ||
090 | _a648450 | ||
100 | _a20160520a2009 k y0engy50 ba | ||
101 | 0 | _aeng | |
135 | _adrcn ---uucaa | ||
181 | 0 | _ai | |
182 | 0 | _ab | |
200 | 1 |
_aEffect of intensified emission during the generation of a submillisecond low-energy electron beam in a plasma-cathode diode _fN. N. Koval [et al.] |
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203 |
_aText _celectronic |
||
300 | _aTitle screen | ||
320 | _a[References: p. 1896 (8 tit.)] | ||
330 | _aThe effect of the intensification of electron emission in a plasma-cathode diode with a grid-stabilized plasma boundary has been investigated. For a pulsed (100-mus) electron beam of 15-20-keV energy that passes through the plasma formed as a result of gas ionization by an electron beam, it has been revealed that an increase in pressure increases the emission current at a fixed plasma-cathode discharge current, and the emission current can become greater in magnitude than the discharge current. It has been shown that a significant increase in electron-beam current is provided by the secondary ion-electron emission that results from the bombardment of the emission electrode surface by the accelerated ions coming from the boundary of the anode plasma | ||
333 | _aРежим доступа: по договору с организацией-держателем ресурса | ||
461 |
_tIEEE Transactions on Plasma Science _d1973- |
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463 |
_tVol. 37, iss. 10 _v[P. 1890-1896] _d2009 |
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610 | 1 | _aэлектронный ресурс | |
610 | 1 | _aтруды учёных ТПУ | |
610 | 1 | _aэлектронный луч | |
610 | 1 | _aплазменный катод | |
701 | 1 |
_aKoval _bN. N. _cspecialist in the field of electronics _cProfessor of Tomsk Polytechnic University, Doctor of technical sciences _f1948- _gNikolay Nikolaevich _2stltpush _3(RuTPU)RU\TPU\pers\34748 |
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701 | 1 |
_aGrigoryev _bS. V. |
|
701 | 1 |
_aDevyatkov _bV. N. |
|
701 | 1 |
_aTeresov _bA. D. |
|
701 | 1 |
_aSchanin _bP. M. |
|
801 | 2 |
_aRU _b63413507 _c20170118 _gRCR |
|
856 | 4 | _uhttp://dx.doi.org/10.1109/TPS.2009.2023412 | |
942 | _cCF |