| 000 | 03134nla2a2200445 4500 | ||
|---|---|---|---|
| 001 | 648944 | ||
| 005 | 20231030040855.0 | ||
| 035 | _a(RuTPU)RU\TPU\network\14103 | ||
| 035 | _aRU\TPU\network\14095 | ||
| 090 | _a648944 | ||
| 100 | _a20160610a2016 k y0engy50 ba | ||
| 101 | 0 | _aeng | |
| 105 | _ay z 100zy | ||
| 135 | _adrcn ---uucaa | ||
| 181 | 0 | _ai | |
| 182 | 0 | _ab | |
| 200 | 1 |
_aSpeckle pattern processing by digital image correlation _fF. A. Gubarev [et al.] |
|
| 203 |
_aText _celectronic |
||
| 225 | 1 | _aInformation and Telecommunications Technologies | |
| 300 | _aTitle screen | ||
| 320 | _a[References: 24 tit.] | ||
| 330 | _aTesting the method of speckle pattern processing based on the digital image correlation is carried out in the current work. Three the most widely used formulas of the correlation coefficient are tested. To determine the accuracy of the speckle pattern processing, test speckle patterns with known displacement are used. The optimal size of a speckle pattern template used for determination of correlation and corresponding the speckle pattern displacement is also considered in the work. | ||
| 461 | 0 |
_0(RuTPU)RU\TPU\network\4526 _tMATEC Web of Conferences |
|
| 463 | 0 |
_0(RuTPU)RU\TPU\network\13956 _tVol. 48 : Space Engineering _oIV Russian Forum for Young Scientists with International Participation, April 12-14, 2016, Tomsk, Russia _o[proceedings] _fNational Research Tomsk Polytechnic University (TPU) ; eds. V. N. Borikov [et al.] _v[04003, 6 p.] _d2016 |
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| 610 | 1 | _aэлектронный ресурс | |
| 610 | 1 | _aтруды учёных ТПУ | |
| 610 | 1 | _aобработка | |
| 610 | 1 | _aшаблоны | |
| 610 | 1 | _aцифровая коррекция | |
| 610 | 1 | _aизображения | |
| 610 | 1 | _aспеклы | |
| 701 | 1 |
_aGubarev _bF. A. _cspecialist in the field of electronics _cAssociate Professor of Tomsk Polytechnic University, Candidate of physical and mathematical sciences _f1979- _gFedor Aleksandrovich _2stltpush _3(RuTPU)RU\TPU\pers\31657 |
|
| 701 | 0 |
_aLi Lin _cspecialist in the field of electronics _cresearch engineer at Tomsk Polytechnic University _f1990- _2stltpush _3(RuTPU)RU\TPU\pers\36367 |
|
| 701 | 1 |
_aKlenovskii (Klenovsky) _bM. S. _cspecialist in the field of electronics _cJunior research fellow Tomsk Polytechnic University _f1984- _gMiron Stanislavovich _2stltpush _3(RuTPU)RU\TPU\pers\36126 |
|
| 701 | 1 |
_aGlotov _bA. F. _cspecialist in the field of electronics _cAssociate Professor of Tomsk Polytechnic University, Candidate of technical sciences _f1940- _gAnatoly Filippovich _2stltpush _3(RuTPU)RU\TPU\pers\36907 |
|
| 712 | 0 | 2 |
_aНациональный исследовательский Томский политехнический университет (ТПУ) _bИнститут неразрушающего контроля (ИНК) _bКафедра промышленной и медицинской электроники (ПМЭ) _h64 _2stltpush _3(RuTPU)RU\TPU\col\18719 |
| 801 | 2 |
_aRU _b63413507 _c20161123 _gRCR |
|
| 856 | 4 | _uhttp://dx.doi.org/10.1051/matecconf/20164804003 | |
| 856 | 4 | _uhttp://earchive.tpu.ru/handle/11683/33697 | |
| 942 | _cCF | ||