| 000 | 03868nla2a2200493 4500 | ||
|---|---|---|---|
| 001 | 650306 | ||
| 005 | 20231030040940.0 | ||
| 035 | _a(RuTPU)RU\TPU\network\15518 | ||
| 035 | _aRU\TPU\network\15514 | ||
| 090 | _a650306 | ||
| 100 | _a20160930a2016 k y0engy50 ba | ||
| 101 | 0 | _aeng | |
| 102 | _aGB | ||
| 105 | _ay z 100zy | ||
| 135 | _adrcn ---uucaa | ||
| 181 | 0 | _ai | |
| 182 | 0 | _ab | |
| 200 | 1 |
_aInfluence of temperature gradient on diffracted X-ray spectrum in quartz crystal _fA. R. Mkrtchan (Mkrtchyan) [et al.] |
|
| 203 |
_aText _celectronic |
||
| 300 | _aTitle screen | ||
| 320 | _a[References: 9 tit.] | ||
| 330 | _aIn this work characteristics of hard X-ray (with energy higher than 30 keV) were investigated. In the experiment we measured spectra of X-ray reflected by a quartz monocrystal in Laue geometry under influence of the temperature gradient. The measurements were made by the spectrometer BDER-KI-11K with 300 eV resolution on the 17.74 keV spectral line of Am241 and the spectrometer XR-100CR with 270 eV resolution on the same spectral line. An existence of temperature gradient leads to increasing of the diffracted beam intensity. The intensity was measured dependently on the temperature of one of the edge of the crystal. | ||
| 461 | 0 |
_0(RuTPU)RU\TPU\network\2008 _tIOP Conference Series: Materials Science and Engineering |
|
| 463 | 0 |
_0(RuTPU)RU\TPU\network\15011 _tVol. 135 : Issues of Physics and Technology in Science, Industry and Medicine _oVIII International Scientific Conference, 1–3 June 2016, Tomsk, Russia _o[proceedings] _v[012028, 5 p.] _d2016 |
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| 610 | 1 | _aэлектронный ресурс | |
| 610 | 1 | _aтруды учёных ТПУ | |
| 610 | 1 | _aтемпературные градиенты | |
| 610 | 1 | _aрентгеновские спектры | |
| 610 | 1 | _aкристаллы | |
| 610 | 1 | _aкварц | |
| 610 | 1 | _aрентгеновские излучения | |
| 701 | 1 |
_aMkrtchan (Mkrtchyan) _bA. R. _cphysicist _cProfessor of Tomsk Polytechnic University, Doctor of physical and mathematical sciences _f1937- _gAlpik Rafaelovich _2stltpush _3(RuTPU)RU\TPU\pers\34236 |
|
| 701 | 1 |
_aPotylitsyn _bA. P. _cRussian physicist _cProfessor of the TPU _f1945- _gAlexander Petrovich _2stltpush _3(RuTPU)RU\TPU\pers\26306 |
|
| 701 | 1 |
_aVukolov _bA. V. _cphysicist _cResearch associate of Tomsk Polytechnic University, Candidate of physical and mathematical sciences _f1978- _gArtem Vladimirovich _2stltpush _3(RuTPU)RU\TPU\pers\31209 |
|
| 701 | 1 |
_aNovokshonov _bA. I. _cspecialist in the field of non-destructive testing _cengineer of Tomsk Polytechnic University _f1990- _gArtem Igorevich _2stltpush _3(RuTPU)RU\TPU\pers\35523 |
|
| 701 | 1 |
_aGogolev _bA. S. _cphysicist _cassociate professor of Tomsk Polytechnic University _f1983- _gAleksey Sergeevich _2stltpush _3(RuTPU)RU\TPU\pers\31537 |
|
| 701 | 1 |
_aAmiragyan _bR. V. |
|
| 701 | 1 |
_aMovsisyan _bA. E. |
|
| 712 | 0 | 2 |
_aНациональный исследовательский Томский политехнический университет (ТПУ) _bФизико-технический институт (ФТИ) _bКафедра прикладной физики (№ 12) (ПФ) _h46 _2stltpush _3(RuTPU)RU\TPU\col\18729 |
| 712 | 0 | 2 |
_aНациональный исследовательский Томский политехнический университет (ТПУ) _bФизико-технический институт (ФТИ) _bКафедра прикладной физики (№ 12) (ПФ) _bМеждународная научно-образовательная лаборатория "Рентгеновская оптика" (МНОЛ РО) _h7002 _2stltpush _3(RuTPU)RU\TPU\col\19530 |
| 801 | 2 |
_aRU _b63413507 _c20170120 _gRCR |
|
| 856 | 4 | _uhttp://dx.doi.org/10.1088/1757-899X/135/1/012028 | |
| 856 | 4 | _uhttp://earchive.tpu.ru/handle/11683/34817 | |
| 942 | _cCF | ||