| 000 | 03638nla2a2200493 4500 | ||
|---|---|---|---|
| 001 | 650546 | ||
| 005 | 20231030040953.0 | ||
| 035 | _a(RuTPU)RU\TPU\network\15764 | ||
| 035 | _aRU\TPU\network\15759 | ||
| 090 | _a650546 | ||
| 100 | _a20161010a2016 k y0engy50 ba | ||
| 101 | 0 | _aeng | |
| 102 | _aGB | ||
| 105 | _ay z 100zy | ||
| 135 | _adrcn ---uucaa | ||
| 181 | 0 | _ai | |
| 182 | 0 | _ab | |
| 200 | 1 |
_aExperimental Research of High-Energy Capabilities of Material Recognition by Dual-Energy Method for the Low- Dose Radiation _fA. Abashkin [et al.] |
|
| 203 |
_aText _celectronic |
||
| 300 | _aTitle screen | ||
| 320 | _a[References: 11 tit.] | ||
| 330 | _aThe algorithm to produce primary radiographs, its transformation by dual energy method and recognition of the object materials were enhanced based on the analysis of experimental results. The experiments were carried out at the inspection complex with high X- ray source - betatron MIB 4/9 in Tomsk Polytechnic University. For the reduced X -ray dose rate, the possibility of recognition of the object materials with thickness from 20 to 120 g/cm{2} was proved under the condition that as the dose rate is reduced by the defined number of times, the segment of the image fragment with the reliably identified material will increase by the same number of times. | ||
| 461 | 0 |
_0(RuTPU)RU\TPU\network\2008 _tIOP Conference Series: Materials Science and Engineering |
|
| 463 | 0 |
_0(RuTPU)RU\TPU\network\15332 _tVol. 132 : Modern Technologies for Non-Destructive Testing _oIV International Conference, 5–10 October 2015, Tomsk, Russia _o[proceedings] _v[012012, 5 p.] _d2016 |
|
| 610 | 1 | _aэлектронный ресурс | |
| 610 | 1 | _aтруды учёных ТПУ | |
| 610 | 1 | _aраспознавание | |
| 610 | 1 | _aэнергия | |
| 610 | 1 | _aмалые дозы | |
| 610 | 1 | _aрадиация | |
| 610 | 1 | _aрентгенограммы | |
| 610 | 1 | _aрентгеновские лучи | |
| 610 | 1 | _aрентгенотехника | |
| 610 | 1 | _aалгоритмы | |
| 701 | 1 |
_aAbashkin _bA. |
|
| 701 | 1 |
_aOsipov _bS. P. _cspecialist in the field of non-destructive testing _cLeading researcher of Tomsk Polytechnic University, candidate of technical sciences _f1958- _gSergey Pavlovich _2stltpush _3(RuTPU)RU\TPU\pers\35098 |
|
| 701 | 1 |
_aChakhlov _bS. V. _cphysicist _cHead of the laboratory of Tomsk Polytechnic University, Candidate of physical and mathematical sciences _f1956- _gSergey Vladimirovich _2stltpush _3(RuTPU)RU\TPU\pers\34254 |
|
| 701 | 1 |
_aStein _bA. M. _cphysicist _cengineer of Tomsk Polytechnic University _f1986- _gAleksandr Mikhailovich _2stltpush _3(RuTPU)RU\TPU\pers\34573 |
|
| 712 | 0 | 2 |
_aНациональный исследовательский Томский политехнический университет (ТПУ) _bИнститут неразрушающего контроля (ИНК) _bРоссийско-китайская научная лаборатория радиационного контроля и досмотра (РКНЛ РКД) _h7433 _2stltpush _3(RuTPU)RU\TPU\col\21551 |
| 712 | 0 | 2 |
_aНациональный исследовательский Томский политехнический университет (ТПУ) _bИнститут неразрушающего контроля (ИНК) _bЛаборатория № 43 (Разработки малогабаритных бетатронов) _h6595 _2stltpush _3(RuTPU)RU\TPU\col\21336 |
| 801 | 2 |
_aRU _b63413507 _c20170120 _gRCR |
|
| 856 | 4 | _uhttp://dx.doi.org/10.1088/1757-899X/132/1/012012 | |
| 856 | 4 | _uhttp://earchive.tpu.ru/handle/11683/33953 | |
| 942 | _cCF | ||