000 | 02770nlm1a2200409 4500 | ||
---|---|---|---|
001 | 650736 | ||
005 | 20231030041001.0 | ||
035 | _a(RuTPU)RU\TPU\network\15985 | ||
035 | _aRU\TPU\network\10676 | ||
090 | _a650736 | ||
100 | _a20161018a2016 k y0engy50 ba | ||
101 | 0 | _aeng | |
102 | _aUS | ||
135 | _adrcn ---uucaa | ||
181 | 0 | _ai | |
182 | 0 | _ab | |
200 | 1 |
_aThe influence of optical properties of paints and coatings on the efficiency of infrared nondestructive testing applied to aluminum aircraft structures _fD. D. Burleigh, V. P. Vavilov, S. S. Pawar |
|
203 |
_aText _celectronic |
||
300 | _aTitle screen | ||
320 | _a[References: p. 238 (19 tit.)] | ||
330 | _aIR NDT (Infrared Nondestructive Testing) is a popular method for detecting defects in composite, ceramic, and metallic structures. The effectiveness of IR NDT depends on various thermal and optical properties of the material being tested. The thermal properties, including thermal conductivity, thermal diffusivity, specific heat and density are important and have been discussed extensively in many treatises on IR NDT. However the optical properties of the surface are equally important and while the thermal properties cannot be changed, sometimes the optical properties can be. | ||
333 | _aРежим доступа: по договору с организацией-держателем ресурса | ||
461 | _tInfrared Physics & Technology | ||
463 |
_tVol. 77 _v[P. 230–238] _d2016 |
||
610 | 1 | _aэлектронный ресурс | |
610 | 1 | _aтруды учёных ТПУ | |
610 | 1 | _aнеразрушающий контроль | |
610 | 1 | _aинфракрасный контроль | |
610 | 1 | _aалюминиевые конструкции | |
610 | 1 | _aсамолеты | |
701 | 1 |
_aBurleigh _bD. D. _gDouglas |
|
701 | 1 |
_aVavilov _bV. P. _cSpecialist in the field of dosimetry and methodology of nondestructive testing (NDT) _cDoctor of technical sciences (DSc), Professor of Tomsk Polytechnic University (TPU) _f1949- _gVladimir Platonovich _2stltpush _3(RuTPU)RU\TPU\pers\32161 |
|
701 | 1 |
_aPawar _bS. S. _cspecialist in the field of non-destructive testing _cAssociate Scientist of Tomsk Polytechnic University _f1980- _gSachin Sampatrao _2stltpush _3(RuTPU)RU\TPU\pers\35940 |
|
712 | 0 | 2 |
_aНациональный исследовательский Томский политехнический университет (ТПУ) _bИнститут неразрушающего контроля (ИНК) _bЛаборатория № 34 (Тепловых методов контроля) _h6591 _2stltpush _3(RuTPU)RU\TPU\col\19616 |
801 | 2 |
_aRU _b63413507 _c20161018 _gRCR |
|
856 | 4 | _uhttp://dx.doi.org/10.1016/j.infrared.2016.06.007 | |
942 | _cCF |