000 02770nlm1a2200409 4500
001 650736
005 20231030041001.0
035 _a(RuTPU)RU\TPU\network\15985
035 _aRU\TPU\network\10676
090 _a650736
100 _a20161018a2016 k y0engy50 ba
101 0 _aeng
102 _aUS
135 _adrcn ---uucaa
181 0 _ai
182 0 _ab
200 1 _aThe influence of optical properties of paints and coatings on the efficiency of infrared nondestructive testing applied to aluminum aircraft structures
_fD. D. Burleigh, V. P. Vavilov, S. S. Pawar
203 _aText
_celectronic
300 _aTitle screen
320 _a[References: p. 238 (19 tit.)]
330 _aIR NDT (Infrared Nondestructive Testing) is a popular method for detecting defects in composite, ceramic, and metallic structures. The effectiveness of IR NDT depends on various thermal and optical properties of the material being tested. The thermal properties, including thermal conductivity, thermal diffusivity, specific heat and density are important and have been discussed extensively in many treatises on IR NDT. However the optical properties of the surface are equally important and while the thermal properties cannot be changed, sometimes the optical properties can be.
333 _aРежим доступа: по договору с организацией-держателем ресурса
461 _tInfrared Physics & Technology
463 _tVol. 77
_v[P. 230–238]
_d2016
610 1 _aэлектронный ресурс
610 1 _aтруды учёных ТПУ
610 1 _aнеразрушающий контроль
610 1 _aинфракрасный контроль
610 1 _aалюминиевые конструкции
610 1 _aсамолеты
701 1 _aBurleigh
_bD. D.
_gDouglas
701 1 _aVavilov
_bV. P.
_cSpecialist in the field of dosimetry and methodology of nondestructive testing (NDT)
_cDoctor of technical sciences (DSc), Professor of Tomsk Polytechnic University (TPU)
_f1949-
_gVladimir Platonovich
_2stltpush
_3(RuTPU)RU\TPU\pers\32161
701 1 _aPawar
_bS. S.
_cspecialist in the field of non-destructive testing
_cAssociate Scientist of Tomsk Polytechnic University
_f1980-
_gSachin Sampatrao
_2stltpush
_3(RuTPU)RU\TPU\pers\35940
712 0 2 _aНациональный исследовательский Томский политехнический университет (ТПУ)
_bИнститут неразрушающего контроля (ИНК)
_bЛаборатория № 34 (Тепловых методов контроля)
_h6591
_2stltpush
_3(RuTPU)RU\TPU\col\19616
801 2 _aRU
_b63413507
_c20161018
_gRCR
856 4 _uhttp://dx.doi.org/10.1016/j.infrared.2016.06.007
942 _cCF