| 000 | 03258nla2a2200457 4500 | ||
|---|---|---|---|
| 001 | 651507 | ||
| 005 | 20231030041037.0 | ||
| 035 | _a(RuTPU)RU\TPU\network\16756 | ||
| 035 | _aRU\TPU\network\16750 | ||
| 090 | _a651507 | ||
| 100 | _a20161115a2016 k y0engy50 ba | ||
| 101 | 0 | _aeng | |
| 105 | _ay z 100zy | ||
| 135 | _adrcn ---uucaa | ||
| 181 | 0 | _ai | |
| 182 | 0 | _ab | |
| 200 | 1 |
_aUnderlying Surface Remote Sensing by the Microwave Radiometer with High Measurement Rate _fA. Ubaichin [et al.] |
|
| 203 |
_aText _celectronic |
||
| 300 | _aTitle screen | ||
| 320 | _a[References: 5 tit.] | ||
| 330 | _aThe paper describes a new approach to microwave radiometer design. The approach implies simultaneous using both modified zero measurement method and multi-receiver technique. Simultaneous using increases the operating characteristics of airborne microwave radiometers for aircrafts with self-contained power supply. The block diagram of the onboard Earth remote sensing microwave radiometric system is presented. The block diagram and operating timing diagrams of the designed radiometer are shown. An original technique to design a fiducial noise source for transfer characteristics is discussed. The advantages of the designed radiometer in comparison with the state of the art zero-type microwave radiometer are described. | ||
| 461 | 0 |
_0(RuTPU)RU\TPU\network\4526 _tMATEC Web of Conferences |
|
| 463 | 0 |
_0(RuTPU)RU\TPU\network\16675 _tVol. 79 : Information-Measuring Equipment and Technologies (IME&T 2016) _oVII Scientific Conference with International Participation, May 25-28, 2016, Tomsk, Russia _o[proceedings] _fNational Research Tomsk Polytechnic University (TPU) ; eds. A. V. Yurchenko ; V. I. Syryamkin _v[01013, 7 p.] _d2016 |
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| 610 | 1 | _aэлектронный ресурс | |
| 610 | 1 | _aтруды учёных ТПУ | |
| 610 | 1 | _aподстилающие поверхности | |
| 610 | 1 | _aдистанционное зондирование | |
| 610 | 1 | _aрадиометры | |
| 701 | 1 |
_aUbaychin (Ubaichin) _bA. V. _cspecialist in the field of control and measurement equipment _cresearcher of Tomsk Polytechnic University, candidate of technical sciences _f1988- _gAnton Viktorovich _2stltpush _3(RuTPU)RU\TPU\pers\36585 |
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| 701 | 1 |
_aAlexeev _bE. _gEgor |
|
| 701 | 1 |
_aZhuk _bG. _gGregory |
|
| 701 | 1 |
_aPlotnikova _bI. V. _cspecialist in the field of quality _cAssociate Professor of the Tomsk Polytechnic University, Candidate of technical sciences _f1965- _gInna Vasilievna _2stltpush _3(RuTPU)RU\TPU\pers\33604 |
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| 701 | 1 |
_aTimofeeva _bE. _gEvgeniya |
|
| 701 | 1 |
_aAbdirasul uulu _bT. _gTilekbek |
|
| 701 | 1 |
_aDanilov _bD. _gDaniil |
|
| 701 | 1 |
_aTashhodgaev _bA. _gAbdulaziz |
|
| 712 | 0 | 2 |
_aНациональный исследовательский Томский политехнический университет (ТПУ) _bИнститут неразрушающего контроля (ИНК) _bКафедра физических методов и приборов контроля качества (ФМПК) _h68 _2stltpush _3(RuTPU)RU\TPU\col\18709 |
| 801 | 2 |
_aRU _b63413507 _c20191204 _gRCR |
|
| 856 | 4 | _uhttp://dx.doi.org/10.1051/matecconf/20167901013 | |
| 856 | 4 | _uhttp://earchive.tpu.ru/handle/11683/35282 | |
| 942 | _cCF | ||