| 000 | 02918nlm1a2200409 4500 | ||
|---|---|---|---|
| 001 | 651713 | ||
| 005 | 20231030041057.0 | ||
| 035 | _a(RuTPU)RU\TPU\network\16975 | ||
| 035 | _aRU\TPU\network\16729 | ||
| 090 | _a651713 | ||
| 100 | _a20161121a2016 k y0engy50 ba | ||
| 101 | 0 |
_aeng _deng |
|
| 135 | _adrcn ---uucaa | ||
| 181 | 0 | _ai | |
| 182 | 0 | _ab | |
| 200 | 1 |
_aUltra-sharp nanofocusing of graded index photonic crystal-based lenses perforated with optimized single defect _fY. H. Li [et al.] |
|
| 203 |
_aText _celectronic |
||
| 300 | _aTitle screen | ||
| 320 | _a[References: p. 2636 (37 tit.)] | ||
| 330 | _aThe single defect structure of a two-dimensional graded index photonic crystal (PC) is investigated. By introduction of an air hole located at center of the photonic crystal-based lenses, we can obtain an extremely small focusing spot, sited at full-width and half maximum (FWHM) as fine as λ/75, which is positioned at the subsurface and top surface of the PCs respectively. Computational calculations were performed on the basis of finite-different time-domain (FDTD) algorithm for the purpose of verifying the feasibility of our design. To study influence of the defect on nanofocusing property of the PC lenses, we set different length of the air holes at center of the PC lenses. The influence of wavelength and material on the nanofocusing performance of the PC lenses is discussed. New applications in optoelectronic devices, nanometrology, bioimaging, and biosensing from the graded index of PC lenses is possible. | ||
| 333 | _aРежим доступа: по договору с организацией-держателем ресурса | ||
| 461 |
_tOptical Materials Express _oScientific Journal |
||
| 463 |
_tVol. 6, iss. 8 _v[P. 2828-2636] _d2016 |
||
| 610 | 1 | _aэлектронный ресурс | |
| 610 | 1 | _aтруды учёных ТПУ | |
| 610 | 1 | _aнанофокусировка | |
| 610 | 1 | _aфотонные кристаллы | |
| 610 | 1 | _aлинзы | |
| 610 | 1 | _aперфорированные материалы | |
| 701 | 1 |
_aLi _bY. H. |
|
| 701 | 1 |
_aFu _bY. Q. |
|
| 701 | 1 |
_aMinin _bO. V. _cphysicist _cprofessor of Tomsk Polytechnic University, Doctor of technical sciences _f1960- _gOleg Vladilenovich _2stltpush _3(RuTPU)RU\TPU\pers\44941 |
|
| 701 | 1 |
_aMinin _bI. V. _cphysicist _cSenior researcherof Tomsk Polytechnic University, Doctor of technical sciences _f1960- _gIgor Vladilenovich _2stltpush _3(RuTPU)RU\TPU\pers\37571 |
|
| 712 | 0 | 2 |
_aНациональный исследовательский Томский политехнический университет (ТПУ) _bИнститут неразрушающего контроля (ИНК) _bКафедра точного приборостроения (ТПС) _h63 _2stltpush _3(RuTPU)RU\TPU\col\18717 |
| 801 | 2 |
_aRU _b63413507 _c20191030 _gRCR |
|
| 856 | 4 | _uhttps://doi.org/10.1364/OME.6.002628 | |
| 942 | _cCF | ||