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035 _a(RuTPU)RU\TPU\network\17913
090 _a652584
100 _a20170118a2016 k y0engy50 ba
101 0 _aeng
102 _aUS
135 _adrcn ---uucaa
181 0 _ai
182 0 _ab
200 1 _aPeculiarities of tunneling current in w-AlN/GaN(0001) two-barrier structures induced by deep-level defects
_fS. N. Grinyaev, A. N. Razzhuvalov
203 _aText
_celectronic
300 _aTitle screen
320 _a[References: 30 tit.]
330 _aThe influence of deep-level defects localized in spacer layers on the tunneling current in a w-AlN/GaN (0001) double-barrier structure is studied. It is shown that the current value essentially depends on the nature and spatial distribution of defects. New effects (screening of built-in fields, negative feedback, fixing of current peaks at high temperature) and a new mechanism of formation of resonances and tunneling current hysteresis caused by deep centers are established. The results of calculation agree with a number of experimental data on the position and temperature dependence of the current peak. It is noted that the current bistability can be caused by multicharged deep centers localized near the heteroboundaries of a double-barrier structure. Due to the defects, electric field in the barriers can reach values, at which the Poole-Frenkel effect should be taken into account.
333 _aРежим доступа: по договору с организацией-держателем ресурса
461 _tJournal of Applied Physics
463 _tVol. 120, iss. 5
_v[154302, 8 p.]
_d2016
610 1 _aэлектронный ресурс
610 1 _aтруды учёных ТПУ
700 1 _aGrinyaev
_bS. N.
_cphysicist
_cAssociate Professor of Tomsk Polytechnic University, Candidate of physical and mathematical science
_f1951-
_gSergey Nikolaevich
_2stltpush
_3(RuTPU)RU\TPU\pers\32574
701 1 _aRazzhuvalov
_bA. N.
_cphysicist
_cassociate Professor of Tomsk Polytechnic University, candidate of physico-mathematical Sciences
_f1976-
_gAlexander Nikolaevich
_2stltpush
_3(RuTPU)RU\TPU\pers\36680
712 0 2 _aНациональный исследовательский Томский политехнический университет (ТПУ)
_bФизико-технический институт (ФТИ)
_bКафедра экспериментальной физики (ЭФ)
_h7596
_2stltpush
_3(RuTPU)RU\TPU\col\21255
801 2 _aRU
_b63413507
_c20170118
_gRCR
856 4 _uhttp://dx.doi.org/10.1063/1.4964876
942 _cCF