| 000 | 03515nla2a2200493 4500 | ||
|---|---|---|---|
| 001 | 653892 | ||
| 005 | 20231030041236.0 | ||
| 035 | _a(RuTPU)RU\TPU\network\19407 | ||
| 035 | _aRU\TPU\network\19402 | ||
| 090 | _a653892 | ||
| 100 | _a20170403a2017 k y0engy50 ba | ||
| 101 | 0 | _aeng | |
| 105 | _ay z 100zy | ||
| 135 | _adrcn ---uucaa | ||
| 181 | 0 | _ai | |
| 182 | 0 | _ab | |
| 200 | 1 |
_aDevelopment the Adjusted Mathematical Model of Responses in the Nondestructive Testing Defectiveness Method Based on the Mechanoelectrical Transformations _fP. N. Khorsov, V. P. Surzhikov, A. A. Demikhova |
|
| 203 |
_aText _celectronic |
||
| 225 | 1 | _aAdjacent to the main theme of the conference issues | |
| 300 | _aTitle screen | ||
| 320 | _a[References: 8 tit.] | ||
| 330 | _aThe improving version the responses mathematical model when using the method of mechanoelectrical transformations for nondestructive testing of defects in composite dielectric materials was examined. The refinement is conditioned by necessity of account of the frequency-dependent attenuation. For this has been used spectral approach: decomposition of excitation pulse in range and the formation of the amount each attenuate spectral component with the sample pulse response. | ||
| 461 | 0 |
_0(RuTPU)RU\TPU\network\2008 _tIOP Conference Series: Materials Science and Engineering |
|
| 463 | 0 |
_0(RuTPU)RU\TPU\network\19289 _tVol. 168 : Radiation-Thermal Effects and Processes in Inorganic Materials (RTEP2016) _oXII International Conference, 4–12 September 2016, Tomsk, Russian Federation _o[proceedings] _v[012106, 6 p.] _d2017 |
|
| 610 | 1 | _aэлектронный ресурс | |
| 610 | 1 | _aтруды учёных ТПУ | |
| 610 | 1 | _aматематические модели | |
| 610 | 1 | _aнеразрушающий контроль | |
| 610 | 1 | _aдефектность | |
| 610 | 1 | _aмеханоэлектрические преобразования | |
| 610 | 1 | _aдефекты | |
| 610 | 1 | _aимпульсный отклик | |
| 610 | 1 | _aимпульсные отклики | |
| 610 | 1 | _aкомпозиционные материалы | |
| 610 | 1 | _aдиэлектрические материалы | |
| 610 | 1 | _aспектральный подход | |
| 700 | 1 |
_aKhorsov _bP. N. _cspecialist in the field of non-destructive testing _csenior researcher of Tomsk Polytechnic University _f1986- _gPetr Nikolaevich _2stltpush _3(RuTPU)RU\TPU\pers\34578 |
|
| 701 | 1 |
_aSurzhikov _bV. P. _cspecialist in the field of non-destructive testing _csenior researcher of Tomsk Polytechnic University, candidate of physical and mathematical sciences _f1954- _gVladimir Petrovich _2stltpush _3(RuTPU)RU\TPU\pers\34577 |
|
| 701 | 1 |
_aDemikhova _bA. A. _cspecialist in the field of non-destructive testing _cEngineer of Tomsk Polytechnic University _f1990- _gAnna Aleksandrovna _2stltpush _3(RuTPU)RU\TPU\pers\33818 |
|
| 712 | 0 | 2 |
_aНациональный исследовательский Томский политехнический университет (ТПУ) _bИнститут неразрушающего контроля (ИНК) _bПроблемная научно-исследовательская лаборатория электроники, диэлектриков и полупроводников (ПНИЛ ЭДиП) _h194 _2stltpush _3(RuTPU)RU\TPU\col\19033 |
| 801 | 2 |
_aRU _b63413507 _c20170404 _gRCR |
|
| 856 | 4 | _uhttp://dx.doi.org/10.1088/1757-899X/168/1/012106 | |
| 856 | 4 | _uhttp://earchive.tpu.ru/handle/11683/37783 | |
| 942 | _cCF | ||