| 000 | 03319nla2a2200421 4500 | ||
|---|---|---|---|
| 001 | 654083 | ||
| 005 | 20231030041245.0 | ||
| 035 | _a(RuTPU)RU\TPU\network\19598 | ||
| 035 | _aRU\TPU\network\14862 | ||
| 090 | _a654083 | ||
| 100 | _a20170407a2016 k y0engy50 ba | ||
| 101 | 0 | _aeng | |
| 105 | _ay z 100zy | ||
| 135 | _adrgn ---uucaa | ||
| 181 | 0 | _ai | |
| 182 | 0 | _ab | |
| 200 | 1 |
_aOptimizing components and evaluating technical performance of IR thermographic NDT systems _fA. O. Chulkov, V. P. Vavilov, S. S. Pawar |
|
| 203 |
_aText _celectronic |
||
| 225 | 1 | _aNondestructive Testing and Composites | |
| 300 | _aTitle screen | ||
| 320 | _a[References: 11 tit.] | ||
| 330 | _aA typical infrared (IR) thermographic system intended for active thermal/IR nondestructive testing includes a heat source, an IR imager and a computer. The software ensures acquisition and processing of IR image sequences to result in a binary map of defects or other image which is to be interpreted by a thermographer in order to meet inspection requirements. Typically, hardware developers supply a certain set of technical parameters of their units, such as heater power, imager temperature resolution, acquisition rate and a set of available data processing algorithms. The suggested approach allows optimization of inspection parameters if thermal and optical parameters of test materials are known. © (2016) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only. | ||
| 333 | _aРежим доступа: по договору с организацией-держателем ресурса | ||
| 461 | 0 |
_0(RuTPU)RU\TPU\network\14324 _tProceedings of SPIE |
|
| 463 | 0 |
_0(RuTPU)RU\TPU\network\14326 _tVol. 9861 : Thermosense: Thermal Infrared Applications XXXVIII _oBaltimore, Maryland, United States, April 17, 2016 _o[proceedings] _v[98610M] _d2016 |
|
| 610 | 1 | _aэлектронный ресурс | |
| 610 | 1 | _aтруды учёных ТПУ | |
| 610 | 1 | _aинфракрасное излучение | |
| 610 | 1 | _aнеразрушающий контроль | |
| 610 | 1 | _aобработка данных | |
| 610 | 1 | _aалгоритмы | |
| 700 | 1 |
_aChulkov _bA. O. _cspecialist in the field of non-destructive testing _cEngineer of Tomsk Polytechnic University _f1989- _gArseniy Olegovich _2stltpush _3(RuTPU)RU\TPU\pers\32220 |
|
| 701 | 1 |
_aVavilov _bV. P. _cSpecialist in the field of dosimetry and methodology of nondestructive testing (NDT) _cDoctor of technical sciences (DSc), Professor of Tomsk Polytechnic University (TPU) _f1949- _gVladimir Platonovich _2stltpush _3(RuTPU)RU\TPU\pers\32161 |
|
| 701 | 1 |
_aPawar _bS. S. _cspecialist in the field of non-destructive testing _cAssociate Scientist of Tomsk Polytechnic University _f1980- _gSachin Sampatrao _2stltpush _3(RuTPU)RU\TPU\pers\35940 |
|
| 712 | 0 | 2 |
_aНациональный исследовательский Томский политехнический университет (ТПУ) _bИнститут неразрушающего контроля (ИНК) _bЛаборатория № 34 (Тепловых методов контроля) _h6591 _2stltpush _3(RuTPU)RU\TPU\col\19616 |
| 801 | 2 |
_aRU _b63413507 _c20170407 _gRCR |
|
| 856 | 4 | _uhttp://dx.doi.org/10.1117/12.2222981 | |
| 942 | _cCF | ||