000 02627nla2a2200421 4500
001 654168
005 20231030041249.0
035 _a(RuTPU)RU\TPU\network\19695
035 _aRU\TPU\network\19693
090 _a654168
100 _a20170413a2017 k y0engy50 ba
101 0 _aeng
105 _ay z 100zy
135 _adrcn ---uucaa
181 0 _ai
182 0 _ab
200 1 _aGating system design for the space device case using T-Flex CAD
_fMunkhe-Zul Ayusheev, T. G. Kostyuchenko
203 _aText
_celectronic
300 _aTitle screen
320 _a[References: 9 tit.]
330 _aThe judicious selection of gating system for the consumable pattern takes a lot of time, labour and other significant resources. The modern design technologies provide quick and effective ways for gating system calculation and casting process simulation. Gating system modeling allows estimating different kinds of defects which can occur at the developing stage of casting process. Moreover, it is possible to modify the whole gating system configuration if some parameters are changed. Analyzing these data and modifying the gating system characteristics high quality of castings can be achieved.
461 0 _0(RuTPU)RU\TPU\network\4526
_tMATEC Web of Conferences
463 0 _0(RuTPU)RU\TPU\network\19686
_tVol. 102 : Space Engineering
_oV International Forum for Young Scientists, April 18-20, 2017, Tomsk, Russia
_o[proceedings]
_fNational Research Tomsk Polytechnic University (TPU) ; eds. V. N. Borikov [et al.]
_v[01005, 5 p.]
_d2017
610 1 _aэлектронный ресурс
610 1 _aтруды учёных ТПУ
610 1 _aстробирование
610 1 _aкорпуса
610 1 _aкосмические аппараты
610 1 _aT-Flex CAD
610 1 _aлитье
610 1 _aотливки
700 0 _aMunkhe-Zul Ayusheev
701 1 _aKostyuchenko
_bT. G.
_cspecialist in the field of instrument making
_cAssociate Professor of Tomsk Polytechnic University, Candidate of technical sciences
_f1956-
_gTamara Georgievna
_2stltpush
_3(RuTPU)RU\TPU\pers\34734
712 0 2 _aНациональный исследовательский Томский политехнический университет (ТПУ)
_bИнститут неразрушающего контроля (ИНК)
_bКафедра точного приборостроения (ТПС)
_h63
_2stltpush
_3(RuTPU)RU\TPU\col\18717
801 2 _aRU
_b63413507
_c20180426
_gRCR
856 4 _uhttp://dx.doi.org/10.1051/matecconf/201710201005
856 4 _uhttp://earchive.tpu.ru/handle/11683/37981
942 _cCF