000 02977nla2a2200481 4500
001 654185
005 20231030041250.0
035 _a(RuTPU)RU\TPU\network\19712
035 _aRU\TPU\network\19688
090 _a654185
100 _a20170413a2017 k y0engy50 ba
101 0 _aeng
105 _ay z 100zy
135 _adrgn ---uucaa
181 0 _ai
182 0 _ab
200 1 _aDesign of optoelectronic system for optical diffusion tomography
_fI. Erakhtin [et al.]
203 _aText
_celectronic
300 _aTitle screen
320 _a[References: 6 tit.]
330 _aThis article explores issues connected with the circuit design of a device for optical diffusion tomography, which we are currently designing. We plan to use the device in experimental studies for the development of a faster method of brain hematoma detection. We reviewed currently existing methods for emergency diagnosis of hematomas, primarily the Infrascanner model 2000, for which we identified weaknesses, and outlined suggestions for improvements. This article describes the method of scanning tissues based on a triangulated arrangement of sources and receivers of optical radiation, and it discusses the optoelectronic system that implements that principle.
461 0 _0(RuTPU)RU\TPU\network\4526
_tMATEC Web of Conferences
463 0 _0(RuTPU)RU\TPU\network\19686
_tVol. 102 : Space Engineering
_oV International Forum for Young Scientists, April 18-20, 2017, Tomsk, Russia
_o[proceedings]
_fNational Research Tomsk Polytechnic University (TPU) ; eds. V. N. Borikov [et al.]
_v[01016, 4 p.]
_d2017
610 1 _aэлектронный ресурс
610 1 _aтруды учёных ТПУ
610 1 _aоптоэлектронные системы
610 1 _aоптическая томография
610 1 _aтомография
610 1 _aсхемотехника
610 1 _aдиффузионная томография
610 1 _aгематомы
610 1 _aмозг
610 1 _aсканирование
610 1 _aоптические излучения
701 1 _aErakhtin
_bI.
_gIgor
701 1 _aAristov
_bA. A.
_cspecialist in the field of electronics
_cAssociate Professor of Tomsk Polytechnic University, Candidate of technical sciences
_f1972-
_gAleksandr Aleksandrovich
_2stltpush
_3(RuTPU)RU\TPU\pers\31701
701 1 _aNovoseltseva
_bA.
_gAnna
701 1 _aSukhanov
_bV.
_gViktor
712 0 2 _aНациональный исследовательский Томский политехнический университет (ТПУ)
_bИнститут неразрушающего контроля (ИНК)
_bКафедра промышленной и медицинской электроники (ПМЭ)
_h64
_2stltpush
_3(RuTPU)RU\TPU\col\18719
801 2 _aRU
_b63413507
_c20180426
_gRCR
856 4 _uhttp://dx.doi.org/10.1051/matecconf/201710201016
856 4 _uhttp://earchive.tpu.ru/handle/11683/37965
942 _cCF