| 000 | 02705nlm1a2200397 4500 | ||
|---|---|---|---|
| 001 | 655623 | ||
| 005 | 20231030041353.0 | ||
| 035 | _a(RuTPU)RU\TPU\network\21882 | ||
| 035 | _aRU\TPU\network\300 | ||
| 090 | _a655623 | ||
| 100 | _a20170919a2001 k y0engy50 ba | ||
| 101 | 0 | _aeng | |
| 102 | _aUS | ||
| 135 | _adrnn ---uucaa | ||
| 181 | 0 | _ai | |
| 182 | 0 | _ab | |
| 200 | 1 |
_aA technique for obtaining thermal resistance of the dielectric-substrate contact under high-intensity irradiation _fD. I. Vaisburd, V. F. Pichugin, M. I. Chebodaev |
|
| 203 |
_aText _celectronic |
||
| 300 | _aTitle screen | ||
| 320 | _a[Ref.: p. 1299 (17 tit.)] | ||
| 330 | _aHeating of dielectric materials is investigated under irradiation of specimens by periodically pulsed ion-beams. The solution to the equation of thermal conductivity yields constrained variations of the specimen's temperature around its average value, with the repetition rate being that of the radiation-pulse frequency. Initially, the average variation-period temperature is found to grow, while after saturation it approaches a quasi-stationary value controlled entirely by the thermal resistance of the specimen-substrate contact under the same irradiation conditions. A method for the time-averaged dielectric temperature under saturation is proposed. Using this method, an express-technique for calculating thermal resistance of the dielectric-substrate contact is offered. It is based on periodically pulsed heating of the dielectric specimen by a moderate-density ion beam and precision measurements of the its average temperature. The error of the express technique is evaluated and so is its applicability range. A hypothesis is put forward that proceeding form this new method for thermal resistance one may determine the energy lost in ion sputtering. | ||
| 333 | _aРежим доступа: по договору с организацией-держателем ресурса | ||
| 461 | _tRussian Physics Journal | ||
| 463 |
_tVol. 44, iss. 12 _v[P. 1289-1299] _d2001 |
||
| 610 | 1 | _aэлектронный ресурс | |
| 610 | 1 | _aтруды учёных ТПУ | |
| 610 | 1 | _aионные пучки | |
| 610 | 1 | _aтеплопроводность | |
| 610 | 1 | _aэкспресс-методы | |
| 610 | 1 | _aтермическое сопротивление | |
| 700 | 1 |
_aVaisburd _bD. I. |
|
| 701 | 1 |
_aPichugin _bV. F. _cProfessor of Tomsk Polytechnic University, Doctor of physical and mathematical sciences _cPhysicist _f1944- _gVladimir Fyodorovich _2stltpush _3(RuTPU)RU\TPU\pers\30933 |
|
| 701 | 1 |
_aChebodaev _bM. I. |
|
| 801 | 2 |
_aRU _b63413507 _c20170919 _gRCR |
|
| 856 | 4 | _uhttp://dx.doi.org/10.1023/A:1015792013118 | |
| 942 | _cCF | ||