| 000 | 02988nla2a2200457 4500 | ||
|---|---|---|---|
| 001 | 656301 | ||
| 005 | 20231030041422.0 | ||
| 035 | _a(RuTPU)RU\TPU\network\22742 | ||
| 035 | _aRU\TPU\network\22734 | ||
| 090 | _a656301 | ||
| 100 | _a20171108a2017 k y0engy50 ba | ||
| 101 | 0 | _aeng | |
| 105 | _ay z 100zy | ||
| 135 | _adrcn ---uucaa | ||
| 181 | 0 | _ai | |
| 182 | 0 | _ab | |
| 200 | 1 |
_aNew method of measuring µ-focus spots of X-ray tubes _fM. Gnedin [et al.] |
|
| 203 |
_aText _celectronic |
||
| 300 | _aTitle screen | ||
| 320 | _a[References: 4 tit.] | ||
| 330 | _aThe practice of non-destructive testing shows that despite the whole range of working standards that define the methods of measurement of µ-focus spot sizes, the consistency and spread of the obtained results are considered unsatisfactory. In the meantime, knowing the accurate size of µ-focus spot is the determinant factor in optimization of control parameters, which is often carried out with geometric magnification. A new design of test object is proposed, a new method of differentiated line profiles of test object digital image is developed and tested, the computing chain and allowances are described. The obtained results have formed the basis for elaboration of a Standard to measure µ-focus spot size of an X-ray tube. | ||
| 333 | _aРежим доступа: по договору с организацией-держателем ресурса | ||
| 461 | 0 |
_0(RuTPU)RU\TPU\network\3526 _tJournal of Physics: Conference Series |
|
| 463 | 0 |
_0(RuTPU)RU\TPU\network\22639 _tVol. 881 : Innovations in Non-Destructive Testing (SibTest 2017) _oInternational Conference, 27–30 June 2017, Novosibirsk, Russian Federation _o[proceedings] _fNational Research Tomsk Polytechnic University (TPU) _v[012031, 6 p.] _d2017 |
|
| 610 | 1 | _aэлектронный ресурс | |
| 610 | 1 | _aтруды учёных ТПУ | |
| 610 | 1 | _aфокусные пятна | |
| 610 | 1 | _aрентгеновские трубки | |
| 610 | 1 | _aнеразрушающий контроль | |
| 610 | 1 | _aцифровые изображения | |
| 610 | 1 | _aрентгеновские изображения | |
| 701 | 1 |
_aGnedin _bM. |
|
| 701 | 1 |
_aUsachev _bE. |
|
| 701 | 1 |
_aValikov _bV. |
|
| 701 | 1 |
_aGheveler _bV. |
|
| 701 | 1 |
_aStein _bA. M. _cphysicist _cengineer of Tomsk Polytechnic University _f1986- _gAleksandr Mikhailovich _2stltpush _3(RuTPU)RU\TPU\pers\34573 |
|
| 712 | 0 | 2 |
_aНациональный исследовательский Томский политехнический университет (ТПУ) _bИнститут неразрушающего контроля (ИНК) _bКафедра физических методов и приборов контроля качества (ФМПК) _h68 _2stltpush _3(RuTPU)RU\TPU\col\18709 |
| 801 | 2 |
_aRU _b63413507 _c20171109 _gRCR |
|
| 856 | 4 | _uhttp://dx.doi.org/10.1088/1742-6596/881/1/012031 | |
| 856 | 4 | _uhttp://earchive.tpu.ru/handle/11683/43864 | |
| 942 | _cCF | ||