000 02663nlm1a2200409 4500
001 657457
005 20231030041512.0
035 _a(RuTPU)RU\TPU\network\23977
090 _a657457
100 _a20180206a2017 k y0engy50 ba
101 0 _aeng
102 _aUS
135 _adrcn ---uucaa
181 0 _ai
182 0 _ab
200 1 _aActive thermal testing of hyperthermoconductive panels
_fO. S. Simonova [et al.]
203 _aText
_celectronic
225 1 _aAcoustic Methods
300 _aTitle screen
320 _a[References: 6 tit.]
330 _aApplication of active infrared thermography to assessing the internal structure and functioning of hyperthermoconductive panels used in on-board electronics is described. Effective thermal- diffusivity maps of hyperthermoconductive panels, obtained using the pulsed Parker method, are presented. The peculiarities of heat transfer in hyperthermoconductive panels are illustrated using experimental modeling in which a local thermal-load source is placed on the surface of hyperthermoconductive panels.
333 _aРежим доступа: по договору с организацией-держателем ресурса
461 _tRussian Journal of Nondestructive Testing
463 _tVol. 53, iss. 6
_v[P. 453-456]
_d2017
610 1 _aэлектронный ресурс
610 1 _aтруды учёных ТПУ
610 1 _aтепловые трубы
610 1 _aтермография
610 1 _aтермодиффузия
701 1 _aSimonova
_bO. S.
_cSpecialist in the field of thermal engineering
_cAssistant of the Department of Tomsk Polytechnic University
_f1986-
_gOlga Sergeevna
_2stltpush
_3(RuTPU)RU\TPU\pers\37861
701 1 _aChulkov
_bA. O.
_cspecialist in the field of non-destructive testing
_cEngineer of Tomsk Polytechnic University
_f1989-
_gArseniy Olegovich
_2stltpush
_3(RuTPU)RU\TPU\pers\32220
701 1 _aVavilov
_bV. P.
_cSpecialist in the field of dosimetry and methodology of nondestructive testing (NDT)
_cDoctor of technical sciences (DSc), Professor of Tomsk Polytechnic University (TPU)
_f1949-
_gVladimir Platonovich
_2stltpush
_3(RuTPU)RU\TPU\pers\32161
701 1 _aSuntsov
_bS. B.
_gSergey Borisovich
712 0 2 _aНациональный исследовательский Томский политехнический университет (ТПУ)
_bИсследовательская школа физики высокоэнергетических процессов (ИШФВП)
_h8118
_2stltpush
_3(RuTPU)RU\TPU\col\23551
801 2 _aRU
_b63413507
_c20180206
_gRCR
856 4 _uhttps://doi.org/10.1134/S1061830917060080
942 _cCF