000 02819nla2a2200421 4500
001 657825
005 20231030041527.0
035 _a(RuTPU)RU\TPU\network\24609
035 _aRU\TPU\network\24605
090 _a657825
100 _a20180323a2018 k y0engy50 ba
101 0 _aeng
105 _ay z 100zy
135 _adrcn ---uucaa
181 0 _ai
182 0 _ab
200 1 _aThe Numerical Simulation of the Shielded Helmholtz Coils System Magnetic Field
_fI. A. Zatonov, P. F. Baranov
203 _aText
_celectronic
210 _d2018
300 _aTitle screen
320 _a[References: 8 tit.]
330 _aThis article describes the calculation of the magnetic field in the axial direction for the Helmholtz coil. The inhomogeneity of the magnetic field for this coil system is calculated. Authors defined the functional connection of the magnetic flux density in the system center from the antimagnetic shield thickness in two ways: iron and Finemet alloy shield. The dependency graph of the magnetic field inhomogeneity in the center of shielded Helmholtz coils system from the axial coordinate value is estimated.
461 0 _0(RuTPU)RU\TPU\network\4526
_tMATEC Web of Conferences
463 0 _0(RuTPU)RU\TPU\network\24598
_tVol. 155 : Information and Measuring Equipment and Technologies (IME&T 2017)
_oVIII International Scientific and Practical Conference, November 22-25, 2017, Tomsk, Russia
_o[proceedings]
_fNational Research Tomsk Polytechnic University (TPU) ; eds. E. Siemens [et al.]
_v[01038, 8 p.]
_d2018
610 1 _aэлектронный ресурс
610 1 _aтруды учёных ТПУ
610 1 _aчисленное моделирование
610 1 _aэлектромагнитные поля
610 1 _aкатушки Гельмогольца
610 1 _aнеоднородности
610 1 _aэкранирование
700 1 _aZatonov
_bI. A.
_cphysicist
_claboratory assistant of Tomsk Polytechnic University
_f1995-
_gIvan Andreevich
_2stltpush
_3(RuTPU)RU\TPU\pers\36674
701 1 _aBaranov
_bP. F.
_cspecialist in the field of control and measurement equipment
_cAssociate Professor of Tomsk Polytechnic University, Candidate of technical sciences
_f1987-
_gPavel Fedorovich
_2stltpush
_3(RuTPU)RU\TPU\pers\34618
712 0 2 _aНациональный исследовательский Томский политехнический университет
_bИнженерная школа неразрушающего контроля и безопасности
_bОтделение электронной инженерии
_h7977
_2stltpush
_3(RuTPU)RU\TPU\col\23507
801 2 _aRU
_b63413507
_c20181022
_gRCR
856 4 _uhttps://doi.org/10.1051/matecconf/201815501038
856 4 _uhttp://earchive.tpu.ru/handle/11683/46982
942 _cCF