| 000 | 04421nlm1a2200469 4500 | ||
|---|---|---|---|
| 001 | 657965 | ||
| 005 | 20231030041532.0 | ||
| 035 | _a(RuTPU)RU\TPU\network\24905 | ||
| 090 | _a657965 | ||
| 100 | _a20180418a2018 k y0engy50 ba | ||
| 101 | 0 | _aeng | |
| 102 | _aUS | ||
| 135 | _adrcn ---uucaa | ||
| 181 | 0 | _ai | |
| 182 | 0 | _ab | |
| 200 | 1 |
_aMicrofocus Bremsstrahlung Source Based on a Narrow Internal Target of a Betatron _fM. M. Rychkov [et al.] |
|
| 203 |
_aText _celectronic |
||
| 300 | _aTitle screen | ||
| 320 | _a[References: 16 tit.] | ||
| 330 | _aThe paper addresses the research into the properties of bremsstrahlung generated by interaction of the internal electron beam of the 18 MeV betatron with narrow targets, 50 and 8μm8μm thick Si crystals and 13μm13μm thick Ta foil with a length of 4 mm along the electron beam, mounted in the goniometer inside the betatron chamber. The radiation beams generated in the targets were used to obtain the images of a microstructure of thin wire pairs and an object that consisted of four steel bars with 10μm10μm gaps between them. The images indicate high absorption contrast of their components due to a small horizontal size of the radiation source the width of which in the cases of Si crystals and Ta foil was 30-, 187- and 115-fold smaller than the diameter of the electron beam, respectively. The edge phase-contrast was also observed due to high spatial coherency of the radiation with the linear microfocus generated in the source based on the B-18 betatron with a narrow target inside. | ||
| 333 | _aРежим доступа: по договору с организацией-держателем ресурса | ||
| 461 | _tJournal of Nondestructive Evaluation | ||
| 463 |
_tVol. 37, iss. 1 _v[13, 8 p.] _d2018 |
||
| 610 | 1 | _aэлектронный ресурс | |
| 610 | 1 | _aтруды учёных ТПУ | |
| 610 | 1 | _aбетатроны | |
| 610 | 1 | _aлучи | |
| 610 | 1 | _aтормозное излучение | |
| 610 | 1 | _aгамма-лучи | |
| 610 | 1 | _aугловые распределения | |
| 701 | 1 |
_aRychkov _bM. M. _cphysicist _cHead of the laboratory of Tomsk Polytechnic University, Candidate of technical sciences _f1977- _gMaksim Mikhailovich _2stltpush _3(RuTPU)RU\TPU\pers\32262 |
|
| 701 | 1 |
_aKaplin _bV. V. _cphysicist _csenior research fellow at Tomsk Polytechnic University _f1947- _gValery Viktorovich _2stltpush _3(RuTPU)RU\TPU\pers\31532 |
|
| 701 | 1 |
_aMalikov _bE. L. _cphysicist _cResearcher of Tomsk Polytechnic University _f1978- _gEvgeny Lvovich (L'vovich) _2stltpush _3(RuTPU)RU\TPU\pers\32863 |
|
| 701 | 1 |
_aSmolyanskiy _bV. A. _cSpecialist in the field of instrument engineering _cEngineer of Tomsk Polytechnic University _f1991- _gVladimir Aleksandrovich _2stltpush _3(RuTPU)RU\TPU\pers\38302 |
|
| 701 | 1 |
_aGentselman _bV. _cphysicist _cengineer of Tomsk Polytechnic University _f1991- _gValentin _2stltpush _3(RuTPU)RU\TPU\pers\36460 |
|
| 701 | 1 |
_aVaskovsky _bI. K. _cspecialist in the field of accelerating equipment _cLeading engineer of Tomsk Polytechnic University _f1941- _gIvan Kirillovich _2stltpush _3(RuTPU)RU\TPU\pers\37633 |
|
| 712 | 0 | 2 |
_aНациональный исследовательский Томский политехнический университет _bИнженерная школа неразрушающего контроля и безопасности _bЦентр промышленной томографии _bНаучно-производственная лаборатория "Бетатронная томография крупногабаритных объектов" _h7983 _2stltpush _3(RuTPU)RU\TPU\col\23717 |
| 712 | 0 | 2 |
_aНациональный исследовательский Томский политехнический университет _bИнженерная школа неразрушающего контроля и безопасности _bОтделение электронной инженерии _h7977 _2stltpush _3(RuTPU)RU\TPU\col\23507 |
| 712 | 0 | 2 |
_aНациональный исследовательский Томский политехнический университет _bИсследовательская школа физики высокоэнергетических процессов _c(2017- ) _h8118 _2stltpush _3(RuTPU)RU\TPU\col\23551 |
| 801 | 2 |
_aRU _b63413507 _c20180418 _gRCR |
|
| 856 | 4 | _uhttps://doi.org/10.1007/s10921-018-0464-6 | |
| 942 | _cCF | ||