| 000 | 03545nlm1a2200505 4500 | ||
|---|---|---|---|
| 001 | 658673 | ||
| 005 | 20231030041602.0 | ||
| 035 | _a(RuTPU)RU\TPU\network\26636 | ||
| 090 | _a658673 | ||
| 100 | _a20181030a2018 k y0engy50 ba | ||
| 101 | 0 | _aeng | |
| 102 | _aNL | ||
| 135 | _adrcn ---uucaa | ||
| 181 | 0 | _ai | |
| 182 | 0 | _ab | |
| 200 | 1 |
_aCombined device for vacuum electron diode adjustment _fI. S. Egorov, A. V. Poloskov |
|
| 203 |
_aText _celectronic |
||
| 300 | _aTitle screen | ||
| 320 | _a[References: p. 13-14 (21 tit.)] | ||
| 330 | _aThe article describes a principle, design and test results of a device for simultaneous capture of electron beam current ejected through an anode and optical image of a cathode surface. The device was tested on “ASTRA-M” pulsed electron accelerator (TPU, Russia) with the following parameters: 300 kV, 0.6 kA and beam current duration of 150 ns (FWHM). Light emission points have been registered for several individual emitters of the tested cathode. CMOS optical sensor of the device provides PC compatibility and detection of disturbances in the cathode or vacuum diode operation for single pulses and in burst mode. The efficiency of electron beam current ejection can be also estimated during vacuum diode adjustment. Detailed cathode images captured by photographic film include both frontal and angle (circular) projections of the cathode surface and can be used to study processes in the accelerating gap. | ||
| 333 | _aРежим доступа: по договору с организацией-держателем ресурса | ||
| 461 | _tNuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment | ||
| 463 |
_tVol. 911 _v[P. 10-14] _d2018 |
||
| 610 | 1 | _aэлектронный ресурс | |
| 610 | 1 | _aтруды учёных ТПУ | |
| 610 | 1 | _aelectron beam | |
| 610 | 1 | _aelectron beam current | |
| 610 | 1 | _avacuum electron diode | |
| 610 | 1 | _aaccelerating gap | |
| 610 | 1 | _acathode surface | |
| 610 | 1 | _aemission surface | |
| 610 | 1 | _aэлектронные пучки | |
| 610 | 1 | _aтоки | |
| 610 | 1 | _aвакуумные электронные диоды | |
| 610 | 1 | _aзазоры | |
| 610 | 1 | _aповерхности | |
| 610 | 1 | _aкатод | |
| 610 | 1 | _aизлучение | |
| 700 | 1 |
_aEgorov _bI. S. _cphysicist _cAssociate Scientist of Tomsk Polytechnic University _f1985- _gIvan Sergeevich _2stltpush _3(RuTPU)RU\TPU\pers\32792 |
|
| 701 | 1 |
_aPoloskov _bA. V. _cphysicist _cEngineer of Tomsk Polytechnic University _f1990- _gArtem Viktorovich _2stltpush _3(RuTPU)RU\TPU\pers\32794 |
|
| 712 | 0 | 2 |
_aНациональный исследовательский Томский политехнический университет _bИсследовательская школа физики высокоэнергетических процессов _c(2017- ) _h8118 _2stltpush _3(RuTPU)RU\TPU\col\23551 |
| 712 | 0 | 2 |
_aНациональный исследовательский Томский политехнический университет _bИнженерная школа новых производственных технологий _bНаучно-производственная лаборатория "Импульсно-пучковых, электроразрядных и плазменных технологий" _h7882 _2stltpush _3(RuTPU)RU\TPU\col\23502 |
| 801 | 2 |
_aRU _b63413507 _c20181030 _gRCR |
|
| 856 | 4 | _uhttps://doi.org/10.1016/j.nima.2018.09.115 | |
| 942 | _cCF | ||