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035 _a(RuTPU)RU\TPU\network\26648
090 _a658685
100 _a20181031a2018 k y0engy50 ba
101 0 _aeng
135 _adrcn ---uucaa
181 0 _ai
182 0 _ab
200 1 _aTunneling current in w-GaN/AlN(0001) structures with deep-level defects
_fA. N. Razzhuvalov, S. N. Grinyaev
203 _aText
_celectronic
300 _aTitle screen
320 _a[References: p. 630 (24 tit.)]
330 _aThe influence of the interface deep-level defects on the tunneling current of a double-barrier w-AlN/GaN (0001) structure is studied. It is shown that the peculiarities of the current essentially depend on the positions of deep-levels, concentrations and spatial distribution of defects. At high concentrations of defects comparable to those of polarization charge, partial compensation of polarization charges near the contacts of the structure occurs and a resonance level in the triangular well can arise. Defective structures can possess a huge peak-to-valley ratio higher than 100 due to the small value of the valley current. The results of the simulations are consistent with some experimental dependences of the tunneling current in double-barrier structures.
333 _aРежим доступа: по договору с организацией-держателем ресурса
461 _tSuperlattices and Microstructures
_oScientific Journal
463 _tVol. 122
_v[P. 624-630]
_d2018
610 1 _aэлектронный ресурс
610 1 _aтруды учёных ТПУ
610 1 _aнитриды
610 1 _aтуннелирование
610 1 _aдефекты
700 1 _aRazzhuvalov
_bA. N.
_cphysicist
_cassociate Professor of Tomsk Polytechnic University, candidate of physico-mathematical Sciences
_f1976-
_gAlexander Nikolaevich
_2stltpush
_3(RuTPU)RU\TPU\pers\36680
701 1 _aGrinyaev
_bS. N.
_cphysicist
_cAssociate Professor of Tomsk Polytechnic University, Candidate of physical and mathematical science
_f1951-
_gSergey Nikolaevich
_2stltpush
_3(RuTPU)RU\TPU\pers\32574
712 0 2 _aНациональный исследовательский Томский политехнический университет
_bИсследовательская школа физики высокоэнергетических процессов
_c(2017- )
_h8118
_2stltpush
_3(RuTPU)RU\TPU\col\23551
801 2 _aRU
_b63413507
_c20181031
_gRCR
856 4 _uhttps://doi.org/10.1016/j.spmi.2018.06.034
942 _cCF