000 04002nlm1a2200385 4500
001 658772
005 20231030041606.0
035 _a(RuTPU)RU\TPU\network\26825
090 _a658772
100 _a20181120a2018 k y0engy50 ba
101 0 _aeng
135 _adrcn ---uucaa
181 0 _ai
182 0 _ab
200 1 _aInfluence of Al2O3 addition on microstructure, defects level and magnetic properties of LiTiZn ferrite ceramics
_fA. V. Malyshev, A. Petrova, A. P. Surzhikov
203 _aText
_celectronic
300 _aTitle screen
320 _a[References: 20 tit.]
330 _aIn the present work, the results of the influence of diamagnetic additives on the defects level of ferrite ceramics, its microstructure and magnetic properties are presented. A method based on a mathematical analysis of the experimental temperature dependences of the initial permeability was used for estimation of the defects level in the samples. Model samples containing a controlled amount of the diamagnetic additive Al2O3 served to test the possibility of monitoring this method of nonmagnetic phases of ferrite ceramics. It was shown that with an increase in the concentration of the Al2O3 additive in the range of (0–0.5) wt%, a significant increase in the defects level was observed almost 6-fold. The data from SEM micrographs showed that the addition of Al2O3 affects the type of grains of ferrite ceramics, but does not affect their grain size. Grains are highly agglomerated and show large grain size dispersion and also pore. Obtained data were compared to hysteresis loop parameters. It is shown that with an increase in the concentration of the Al2O3 addition, there is a regular decrease in the residual induction and an increase in the coercive force. However, such changes in hysteresis loop parameters are small in comparison to defects level. Investigations of the true physical broadening of the diffraction reflections were performed for the same model samples in order to compare the change in the defects level to the direct X-ray diffraction measurements of micro deformations. The defects level as a characteristic of the elastic stress of a ferrite ceramics is proposed. This assumption follows from a linear relationship between the defects level and the width of the diffraction reflections. The consistency of the obtained results made it possible to evaluate the high efficiency and sensitivity of the method for defects level estimating.
333 _aРежим доступа: по договору с организацией-держателем ресурса
461 _tCeramics International
_d1981-
463 _tVol. 44, iss. 17
_v[P. 20749-20754]
_d2018
610 1 _aэлектронный ресурс
610 1 _aтруды учёных ТПУ
610 1 _aспекание
610 1 _aдефекты
610 1 _aмагнитные свойства
610 1 _aферриты
700 1 _aMalyshev
_bA. V.
_cSpecialist in the field of electrical engineering
_cSenior researcher at Tomsk Polytechnic University, Candidate of Physics and Mathematics (PhD Phys.-Math.)
_f1978-
_gAndrei Vladimirovich
_2stltpush
_3(RuTPU)RU\TPU\pers\30965
701 1 _aPetrova
_bA.
_gAnna
701 1 _aSurzhikov
_bA. P.
_cphysicist
_cProfessor of Tomsk Polytechnic University, doctor of physical and mathematical sciences (DSc)
_f1951-
_gAnatoly Petrovich
_2stltpush
_3(RuTPU)RU\TPU\pers\30237
712 0 2 _aНациональный исследовательский Томский политехнический университет (ТПУ)
_bИнститут неразрушающего контроля (ИНК)
_bПроблемная научно-исследовательская лаборатория электроники, диэлектриков и полупроводников (ПНИЛ ЭДиП)
_h194
_2stltpush
_3(RuTPU)RU\TPU\col\19033
801 2 _aRU
_b63413507
_c20181120
_gRCR
856 4 _uhttps://doi.org/10.1016/j.ceramint.2018.08.073
942 _cCF