000 | 03055nlm1a2200433 4500 | ||
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001 | 658843 | ||
005 | 20231030041609.0 | ||
035 | _a(RuTPU)RU\TPU\network\27013 | ||
090 | _a658843 | ||
100 | _a20181205a2018 k y0engy50 ba | ||
101 | 0 | _aeng | |
102 | _aUS | ||
135 | _adrcn ---uucaa | ||
181 | 0 | _ai | |
182 | 0 | _ab | |
200 | 1 |
_aSmall-Angle Acoustic Tomography under Shadow Testing with Antenna Arrays _fA. A. Soldatov [et al.] |
|
203 |
_aText _celectronic |
||
300 | _aTitle screen | ||
320 | _a[References: 20 tit.] | ||
330 | _aResults of the experimental studies of an acoustic tract by the shadow testing method are provided. An inhomogeneous distribution of acoustic rays is revealed within the testing zone. The principle of producing a tomogram under small–angle probing is demonstrated. As a result of studying the error in determining the coordinates of flaws in different parts of the testing zone, it has been established that the least error corresponds to the flaw position at the center of the testing zone. | ||
333 | _aРежим доступа: по договору с организацией-держателем ресурса | ||
461 | _tRussian Journal of Nondestructive Testing | ||
463 |
_tVol. 54, iss. 7 _v[P. 463–468] _d2018 |
||
610 | 1 | _aэлектронный ресурс | |
610 | 1 | _aтруды учёных ТПУ | |
610 | 1 | _aтеневые методы | |
610 | 1 | _aтестирование | |
610 | 1 | _aдефекты | |
610 | 1 | _aтомограммы | |
610 | 1 | _aантенны | |
701 | 1 |
_aSoldatov _bA. A. _cspecialist in the field of electronics _cengineer, Senior Lecturer of Tomsk Polytechnic University, candidate of technical Sciences _f1988- _gAndrey Alekseevich _2stltpush _3(RuTPU)RU\TPU\pers\35417 |
|
701 | 1 |
_aSorokin _bP. V. _cspecialist in the field of electronics _cAssociate Professor of Tomsk Polytechnic University, engineer, candidate of technical sciences _f1960- _gPavel Vladimirovich _2stltpush _3(RuTPU)RU\TPU\pers\35313 |
|
701 | 1 |
_aSoldatov _bA. I. _cspecialist in the field of electronics _cProfessor of Tomsk Polytechnic University, doctor of technical Sciences _f1958- _gAleksey Ivanovich _2stltpush _3(RuTPU)RU\TPU\pers\31243 |
|
701 | 1 |
_aKostina _bM. A. _cspecialist in the field of electronics _cAssistant of the Department of Tomsk Polytechnic University _f1991- _gMaria Alekseevna _2stltpush _3(RuTPU)RU\TPU\pers\42383 |
|
701 | 1 |
_aShulgina _bYu. V. _cspecialist in the field of electronics _cengineer Tomsk Polytechnic University _f1987- _gYulia Viktorovna _2stltpush _3(RuTPU)RU\TPU\pers\33688 |
|
712 | 0 | 2 |
_aНациональный исследовательский Томский политехнический университет _bИнженерная школа неразрушающего контроля и безопасности _bОтделение электронной инженерии _h7977 _2stltpush _3(RuTPU)RU\TPU\col\23507 |
801 | 2 |
_aRU _b63413507 _c20181205 _gRCR |
|
856 | 4 | _uhttps://doi.org/10.1134/S1061830918070070 | |
942 | _cCF |