| 000 | 04991nlm0a2200445 4500 | ||
|---|---|---|---|
| 001 | 658991 | ||
| 005 | 20231030041614.0 | ||
| 035 | _a(RuTPU)RU\TPU\network\27269 | ||
| 090 | _a658991 | ||
| 100 | _a20181220d2018 k y0engy50 ba | ||
| 101 | 0 | _aeng | |
| 105 | _ay z 100zy | ||
| 135 | _adrcn ---uucaa | ||
| 181 | 0 | _ai | |
| 182 | 0 | _ab | |
| 200 | 1 |
_aPolycapillary-Based X-Ray Tomography of Complex Samples with Porous Matrix _fYu. M. Cherepennikov [et al.] |
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| 203 |
_aText _celectronic |
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| 300 | _aTitle screen | ||
| 330 | _aX-ray computed tomography (CT) is one of the most advanced methods for the non-destructive investigation of the internal structures of various objects. Researchers have been developing instrumentations for the CT research over several decades. As a result, some modern units can provide a spatial resolution of about several microns but their contrast resolution is often not high enough for CT analysis. The problem becomes even more evident for the studies on the imaging of low-absorbing and consequently low-contrast objects at conventional X-ray tube based table-top facilities. Indeed, organic porous objects are extremely hard to investigate at laboratory facilities, and the corresponding X-ray images obtained are characterized by low quality. Moreover, CT imaging of the objects composed by both low and high absorbing parts is even more problematic due to the mistakes occurring during mathematical reconstruction [1]. These mistakes may result in various “artefacts” in final reconstructed images. One of the ways to increase the image quality for such objects is to utilize a more intense X-ray flux going through the investigated sample. High radiation flux on a sample can be obtained by either the X-ray source current or the longer exposition time. Both these options have an obvious drawback: they require either greater maximum X-ray source power or longer measurement time. An alternative approach is based on the application of X-ray concentrating optical elements, for instance, polycapillary lenses or semilenses, in experimental setups in order to collect photons from the primary divergent beam and guide them to the sample [2, 3]. On the other hand, controlling the geometry of the primary beam provides us with an additional option necessary for a new approach in 3D tomography. | ||
| 463 |
_tCharged and Neutral Particles Channeling Phenomena _oBook of Abstracts of the 8th International Conference, September 23-28, 2018, Naples, Italy _v[2 p.] _d2018 |
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| 610 | 1 | _aэлектронный ресурс | |
| 610 | 1 | _aтруды учёных ТПУ | |
| 610 | 1 | _aполикапиллярная оптика | |
| 610 | 1 | _aрентгеновская томография | |
| 610 | 1 | _aпористые материалы | |
| 701 | 1 |
_aCherepennikov _bYu. M. _cphysicist _cAssociate Professor of Tomsk Polytechnic University, Candidate of Sciences _f1989- _gYuriy Mihaylovich _2stltpush _3(RuTPU)RU\TPU\pers\31561 |
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| 701 | 1 |
_aHampai _bD. _gDarjyush |
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| 701 | 1 |
_aAzzutti _bC. _gClaudia |
|
| 701 | 1 |
_aKrasnykh _bA. A. _cphysicist _cengineer of Tomsk Polytechnic University _f1993- _gAngelina Aleksandrovna _2stltpush _3(RuTPU)RU\TPU\pers\42218 |
|
| 701 | 1 |
_aMiloichikova _bI. A. _cphysicist _cengineer of Tomsk Polytechnic University _f1988- _gIrina Alekseevna _2stltpush _3(RuTPU)RU\TPU\pers\35525 |
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| 701 | 1 |
_aStuchebrov _bS. G. _cphysicist _cAssociate Professor of Tomsk Polytechnic University, Candidate of Sciences _f1981- _gSergey Gennadevich _2stltpush _3(RuTPU)RU\TPU\pers\31559 |
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| 701 | 1 |
_aBatranin _bA. V. _cSpecialist in the field of welding production _cAssistant of Tomsk Polytechnic University _f1980- _gAndrey Viktorovich _2stltpush _3(RuTPU)RU\TPU\pers\32706 |
|
| 701 | 1 |
_aDabagov _bS. B. _gSultan Barasbievich |
|
| 712 | 0 | 2 |
_aНациональный исследовательский Томский политехнический университет _bИнженерная школа ядерных технологий _bОтделение ядерно-топливного цикла _h7864 _2stltpush _3(RuTPU)RU\TPU\col\23554 |
| 712 | 0 | 2 |
_aНациональный исследовательский Томский политехнический университет _bИсследовательская школа физики высокоэнергетических процессов _c(2017- ) _h8118 _2stltpush _3(RuTPU)RU\TPU\col\23551 |
| 712 | 0 | 2 |
_aНациональный исследовательский Томский политехнический университет (ТПУ) _bИнститут неразрушающего контроля (ИНК) _bРоссийско-китайская научная лаборатория радиационного контроля и досмотра (РКНЛ РКД) _h7433 _2stltpush _3(RuTPU)RU\TPU\col\21551 |
| 801 | 1 |
_aRU _b63413507 _c20141010 |
|
| 801 | 2 |
_aRU _b63413507 _c20200316 _gRCR |
|
| 856 | 4 | _uhttps://agenda.infn.it/event/14872/contributions/26992/ | |
| 942 | _cCF | ||