| 000 | 03354nlm2a2200397 4500 | ||
|---|---|---|---|
| 001 | 659616 | ||
| 005 | 20231030041635.0 | ||
| 035 | _a(RuTPU)RU\TPU\network\28283 | ||
| 090 | _a659616 | ||
| 100 | _a20190311a2018 k y0engy50 ba | ||
| 101 | 0 | _aeng | |
| 102 | _aFR | ||
| 105 | _ay z 100zy | ||
| 135 | _adrcn ---uucaa | ||
| 181 | 0 | _ai | |
| 182 | 0 | _ab | |
| 200 | 1 |
_aEffect of Mechanical Load on Defects Level in Soft Ferrite Ceramics _fA. B. Petrova, A. V. Malyshev, A. P. Surzhikov |
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| 203 |
_aText _celectronic |
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| 300 | _aTitle screen | ||
| 320 | _a[References: 11 tit.] | ||
| 330 | _aThe article presents the results of a study of the effect of mechanical load on the temperature dependence of the initial permeability of LiTiZn soft ferrite ceramics. Regimes of mechanical load were created by a steel non-magnetic ring with screws. In this work, four levels of mechanical load were investigated: without load, with 1, 2 and 3 screws. For obtaining temperature dependences and exclude the influence of prehistory on the initial permeability, the samples were heated to a temperature exceeding the Curie point by 50 degrees, after which they slowly cooled to room temperature. The defects level was determined by the ratio of the parameters ? / ? of the phenomenological expression, which describes the experimental temperature dependences. It is shown that as the mechanical load increases, the defects level of ferrite ceramics increases, and after load removing, it returns to its original level. | ||
| 461 | 0 |
_0(RuTPU)RU\TPU\network\7958 _tEuropean Physical Journal Web of Conferences (EPJ Web of Conferences) |
|
| 463 |
_tVol. 186 : Engineering Mathematics and Physics (ICEMP 2018) _o7th International Conference, Prague, Czech Republic, June 15-18, 2018 _v[02010, 4 р.] _d2018 |
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| 610 | 1 | _aэлектронный ресурс | |
| 610 | 1 | _aтруды учёных ТПУ | |
| 610 | 1 | _aмеханические нагрузки | |
| 610 | 1 | _aферритовая керамика | |
| 610 | 1 | _aтемпературные зависимости | |
| 700 | 1 |
_aPetrova _bA. B. _cspecialist in the field of non-destructive testing _cAssociate Scientist of Tomsk Polytechnic University _f1992- _gAnna Borisovna _2stltpush _3(RuTPU)RU\TPU\pers\36438 |
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| 701 | 1 |
_aMalyshev _bA. V. _cSpecialist in the field of electrical engineering _cSenior researcher at Tomsk Polytechnic University, Candidate of Physics and Mathematics (PhD Phys.-Math.) _f1978- _gAndrei Vladimirovich _2stltpush _3(RuTPU)RU\TPU\pers\30965 |
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| 701 | 1 |
_aSurzhikov _bA. P. _cphysicist _cProfessor of Tomsk Polytechnic University, doctor of physical and mathematical sciences (DSc) _f1951- _gAnatoly Petrovich _2stltpush _3(RuTPU)RU\TPU\pers\30237 |
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| 712 | 0 | 2 |
_aНациональный исследовательский Томский политехнический университет (ТПУ) _bИнститут неразрушающего контроля (ИНК) _bПроблемная научно-исследовательская лаборатория электроники, диэлектриков и полупроводников (ПНИЛ ЭДиП) _h194 _2stltpush _3(RuTPU)RU\TPU\col\19033 |
| 801 | 2 |
_aRU _b63413507 _c20200218 _gRCR |
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| 856 | 4 | _uhttps://doi.org/10.1051/matecconf/201818602010 | |
| 856 | 4 | _uhttp://earchive.tpu.ru/handle/11683/57824 | |
| 942 | _cCF | ||