| 000 | 03298nla2a2200481 4500 | ||
|---|---|---|---|
| 001 | 659654 | ||
| 005 | 20231030041637.0 | ||
| 035 | _a(RuTPU)RU\TPU\network\28323 | ||
| 035 | _aRU\TPU\network\28316 | ||
| 090 | _a659654 | ||
| 100 | _a20190313d2019 k y0engy50 ba | ||
| 101 | 0 | _aeng | |
| 102 | _aGB | ||
| 105 | _ay z 100zy | ||
| 135 | _avrgn ---uucaa | ||
| 181 | 0 | _ai | |
| 182 | 0 | _ab | |
| 200 | 1 |
_aCalculation of macrodefects coordinates in dielectric specimens on the two-dimensional mathematical model of mechanoeletric transformations method _fR. A. Laas, P. N. Khorsov, A. P. Surzhikov |
|
| 203 |
_aText _celectronic |
||
| 300 | _aTitle screen | ||
| 320 | _a[References: 8 tit.] | ||
| 330 | _aTwo-dimensional mathematical model of dielectric specimen was used to determine the capability of mechanoelectrical transformations (MET) method to localize macrodefects. Amplitude and phase characteristics of response signal analytical representation were used as response parameters. Three different types of short radiofrequency pulses were chosen for the excitation. A short sin curve of a single period interval is most useful to search the position of the defect, whilst pulses of higher frequencies and are better for location depth evaluation. | ||
| 461 | 1 |
_0(RuTPU)RU\TPU\network\2008 _tIOP Conference Series: Materials Science and Engineering |
|
| 463 | 1 |
_0(RuTPU)RU\TPU\network\28312 _tVol. 457 : Modern Technologies for Non-Destructive Testing _oVII International Conference, 8–13 October 2018, Tomsk, Russian Federation _o[proceedings] _v[012020, 5 p.] _d2019 |
|
| 610 | 1 | _aэлектронный ресурс | |
| 610 | 1 | _aтруды учёных ТПУ | |
| 610 | 1 | _aкоординаты | |
| 610 | 1 | _aдефекты | |
| 610 | 1 | _aдиэлектрические образцы | |
| 610 | 1 | _aдвумерные модели | |
| 610 | 1 | _aматематические модели | |
| 610 | 1 | _aмеханоэлектрические преобразования | |
| 610 | 1 | _aсигналы | |
| 610 | 1 | _aимпульсы | |
| 700 | 1 |
_aLaas _bR. A. _cPhysicist _cAssistant of the Department of Tomsk Polytechnic University _f1991- _gRoman Aleksandrovich _2stltpush _3(RuTPU)RU\TPU\pers\35139 |
|
| 701 | 1 |
_aKhorsov _bP. N. _cspecialist in the field of non-destructive testing _csenior researcher of Tomsk Polytechnic University _f1986- _gPetr Nikolaevich _2stltpush _3(RuTPU)RU\TPU\pers\34578 |
|
| 701 | 1 |
_aSurzhikov _bA. P. _cphysicist _cProfessor of Tomsk Polytechnic University, doctor of physical and mathematical sciences (DSc) _f1951- _gAnatoly Petrovich _2stltpush _3(RuTPU)RU\TPU\pers\30237 |
|
| 712 | 0 | 2 |
_aНациональный исследовательский Томский политехнический университет (ТПУ) _bИнститут неразрушающего контроля (ИНК) _bПроблемная научно-исследовательская лаборатория электроники, диэлектриков и полупроводников (ПНИЛ ЭДиП) _h194 _2stltpush _3(RuTPU)RU\TPU\col\19033 |
| 801 | 1 |
_aRU _b63413507 _c20150101 _gRCR |
|
| 801 | 2 |
_aRU _b63413507 _c20190319 _gRCR |
|
| 856 | 4 | _uhttp://dx.doi.org/10.1088/1757-899X/457/1/012020 | |
| 856 | 4 | _uhttp://earchive.tpu.ru/handle/11683/53002 | |
| 942 | _cCF | ||