| 000 | 04201nla2a2200505 4500 | ||
|---|---|---|---|
| 001 | 660932 | ||
| 005 | 20231030041728.0 | ||
| 035 | _a(RuTPU)RU\TPU\network\31070 | ||
| 035 | _aRU\TPU\network\31069 | ||
| 090 | _a660932 | ||
| 100 | _a20191107a2019 k y0engy50 ba | ||
| 101 | 0 | _aeng | |
| 102 | _aCH | ||
| 105 | _ay z 100zy | ||
| 135 | _adrgn ---uucaa | ||
| 181 | 0 | _ai | |
| 182 | 0 | _ab | |
| 200 | 1 |
_aThe Mathematical Model of the Broadband Transmission X-Ray Thickness Gauge _fS. P. Osipov [et al.] |
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| 203 |
_aText _celectronic |
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| 300 | _aTitle screen | ||
| 330 | _aThe mathematical model of the broadband transmission X-ray thickness gauge is developed. The mathematical model consists of sectors: generation and transformation of radiometric signals; equation of transmission X-ray thickness gauge; error estimation of thickness measurement; performance rating. The example of the use of the proposed model to calculate of the transmission X-ray thickness gauge for aluminum items is provided. In the example the dependences of integral mass X-ray attenuation coefficients and the thickness of monitored objects made from aluminum are calculated. The range of optimum measured thickness depending on the maximum X-ray energy was selected, the measurement time to provide the desired thickness measurement error was estimated. The possibility of measuring the thickness of a cooper test object for a wide beam conditions has been experimentally confirmed. | ||
| 333 | _aРежим доступа: по договору с организацией-держателем ресурса | ||
| 461 | 0 |
_0(RuTPU)RU\TPU\network\24092 _tMaterials Science Forum _oScientific Journal |
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| 463 | 0 |
_0(RuTPU)RU\TPU\network\30892 _tVol. 970 : Modern Problems in Materials Processing, Manufacturing, Testing and Quality Assurance II _oSeptember 2019, Tomsk, Russia _fNational Research Tomsk Polytechnic University (TPU) ; ed. A. P. Surzhikov _v[P. 210-218] _d2019 |
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| 610 | 1 | _aэлектронный ресурс | |
| 610 | 1 | _aтруды учёных ТПУ | |
| 610 | 1 | _aMass Attenuation Coefficient of Photon Radiation | |
| 610 | 1 | _aThickness Measurement | |
| 610 | 1 | _aThickness Measurement Error | |
| 610 | 1 | _aX-Ray | |
| 610 | 1 | _aкоэффициент затухания | |
| 610 | 1 | _aфотонные излучения | |
| 610 | 1 | _aизмерения | |
| 610 | 1 | _aтолщина | |
| 610 | 1 | _aошибки измерения | |
| 610 | 1 | _aрентгеновские излучения | |
| 701 | 1 |
_aOsipov _bS. P. _cspecialist in the field of non-destructive testing _cLeading researcher of Tomsk Polytechnic University, candidate of technical sciences _f1958- _gSergey Pavlovich _2stltpush _3(RuTPU)RU\TPU\pers\35098 |
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| 701 | 1 |
_aChakhlov _bS. V. _cphysicist _cHead of the laboratory of Tomsk Polytechnic University, Candidate of physical and mathematical sciences _f1956- _gSergey Vladimirovich _2stltpush _3(RuTPU)RU\TPU\pers\34254 |
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| 701 | 1 |
_aKairalapov _bD. _cSpecialist in the field of material science _cEngineer of Tomsk Polytechnic University _f1989- _gDaniyar _2stltpush _3(RuTPU)RU\TPU\pers\45040 |
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| 701 | 1 |
_aOsipov _bO. S. _cspecialist in the field of non-destructive testing _cresearch engineer of Tomsk Polytechnic University _f1984- _gOleg Sergeevich _2stltpush _3(RuTPU)RU\TPU\pers\36463 |
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| 712 | 0 | 2 |
_aНациональный исследовательский Томский политехнический университет _bИнститут неразрушающего контроля _bРоссийско-китайская научная лаборатория радиационного контроля и досмотра _h7433 _2stltpush _3(RuTPU)RU\TPU\col\21551 |
| 712 | 0 | 2 |
_aНациональный исследовательский Томский политехнический университет _bИнженерная школа новых производственных технологий _bНаучно-производственная лаборатория "Чистая вода" _h7886 _2stltpush _3(RuTPU)RU\TPU\col\23657 |
| 801 | 2 |
_aRU _b63413507 _c20191108 _gRCR |
|
| 856 | 4 | _uhttps://doi.org/10.4028/www.scientific.net/MSF.970.210 | |
| 942 | _cCF | ||