000 03481nla2a2200517 4500
001 660944
005 20231030041728.0
035 _a(RuTPU)RU\TPU\network\31095
035 _aRU\TPU\network\31078
090 _a660944
100 _a20191108a2019 k y0engy50 ba
101 0 _aeng
102 _aCH
105 _ay z 100zy
135 _adrgn ---uucaa
181 0 _ai
182 0 _ab
200 1 _aStudy of the Effect of Low-Frequency Interference on Resistance-to-Voltage Converter in Cable Insulation Testing
_fN. I. Ermoshin, E. V. Yakimov, A. E. Goldstein
203 _aText
_celectronic
300 _aTitle screen
330 _aThe study focuses on the effect of low-frequency noise on resistance converter of teraommeters to test cable insulation. A mathematical pendulum was used to simulate low frequency electromagnetic interference. It was found that the greatest effect is exerted by dynamic effects of electrostatic charges that accumulate on the printed circuit board, electronic components, structural elements of the resistance-to-voltage converter, and on the test cable sheath. The effect of constant and alternating magnetic fields on measurement of resistance of insulating materials is insignificant.
333 _aРежим доступа: по договору с организацией-держателем ресурса
461 0 _0(RuTPU)RU\TPU\network\24092
_tMaterials Science Forum
_oScientific Journal
463 0 _0(RuTPU)RU\TPU\network\30892
_tVol. 970 : Modern Problems in Materials Processing, Manufacturing, Testing and Quality Assurance II
_oSeptember 2019, Tomsk, Russia
_fNational Research Tomsk Polytechnic University (TPU) ; ed. A. P. Surzhikov
_v[P. 297-304]
_d2019
610 1 _aэлектронный ресурс
610 1 _aтруды учёных ТПУ
610 1 _aCable
610 1 _aElectrostatic Charge
610 1 _aInsulation Resistance
610 1 _aInterference
610 1 _aMathematical Pendulum
610 1 _aResistance-to-Voltage Converter
610 1 _aкабели
610 1 _aэлектростатический заряд
610 1 _aсопротивление
610 1 _aизоляция
610 1 _aпомехи
610 1 _aматематические маятники
610 1 _aпреобразователи напряжения
700 1 _aErmoshin
_bN. I.
_cSpecialist in the field of instrument engineering
_cEngineer of Tomsk Polytechnic University
_f1992-
_gNikolay Ivanovich
_2stltpush
_3(RuTPU)RU\TPU\pers\45060
701 1 _aYakimov
_bE. V.
_cspecialist in the field of control and measurement equipment
_cAssociate Professor of Tomsk Polytechnic University, Candidate of technical sciences
_f1975-
_gEvgeny Valeryevich
_2stltpush
_3(RuTPU)RU\TPU\pers\31173
701 1 _aGoldstein
_bA. E.
_cSpecialist in the field of non-destructive testing
_cProfessor of Tomsk Polytechnic University, Doctor of technical sciences
_f1954-
_gAleksandr Efremovich
_2stltpush
_3(RuTPU)RU\TPU\pers\32322
712 0 2 _aНациональный исследовательский Томский политехнический университет
_bИнженерная школа неразрушающего контроля и безопасности
_bОтделение контроля и диагностики
_h7978
_2stltpush
_3(RuTPU)RU\TPU\col\23584
801 2 _aRU
_b63413507
_c20191108
_gRCR
856 4 _uhttps://doi.org/10.4028/www.scientific.net/MSF.970.297
942 _cCF