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100 _a20191114a2019 k y0engy50 ba
101 0 _aeng
102 _aNL
135 _adrcn ---uucaa
181 0 _ai
182 0 _ab
200 1 _aStructure and electrical properties of polyaniline-based copper chloride or copper bromide coatings deposited via low-energy electron beam
_fA. A. Rogachev [et al.]
203 _aText
_celectronic
300 _aTitle screen
320 _a[References: 34 tit.]
330 _aThin conductive nanostructured polyaniline coatings were formed by the solvent-free plasma-chemical method. Non-conductive form of an emeraldine base and crystalline hydrate of dichloride or copper dibromide were used as a target. The structure and electrophysical properties of the formed coatings were studied by spectroscopic and microscopic methods. It was demonstrated that the layers represent a polymer matrix with various degree of oxidation doped by chloride or copper bromide compounds. When mixtures of an emeraldine base and copper bromide are jointly dispersed, the formation of layers with relative concentration of its oxidized chains by more than three times bigger than the layers formed by dispersion of the emeraldine base and copper chloride is observed. The proposed method allows the deposition of thin composite PANI-based coatings which have conductivity up to 10?S/cm, adjustable degree of oxidation and a molecular structure of polyaniline chains. The proposed method allows the deposition of thin composite PANI-based coatings which have conductivity up to 10?S/cm, adjustable degree of oxidation and a molecular structure of polyaniline chains.
333 _aРежим доступа: по договору с организацией-держателем ресурса
461 _tApplied Surface Science
463 _tVol. 483
_v[P. 19-25]
_d2019
610 1 _aэлектронный ресурс
610 1 _aтруды учёных ТПУ
610 1 _aactive gas phase
610 1 _alow-energy electron beam deposition
610 1 _apolyaniline-based nanocomposite coating
610 1 _aimpedance spectroscopy
610 1 _aгазовые фазы
610 1 _aнанокомпозитные покрытия
610 1 _aполианилин
610 1 _aимпеданская спектрометрия
610 1 _aнизкоэнергетические электроны
701 1 _aRogachev
_bA. A.
701 1 _aYarmolenko
_bM. A.
701 1 _aRogachev
_bA. V.
701 0 _aJiang Xiaohong
701 0 _aHongtao Cao
701 1 _aLysenko
_bE. N.
_cSpecialist in the field of electrical engineering
_cHead of the laboratory of Tomsk Polytechnic University, Candidate of physical and mathematical sciences
_f1972-
_gElena Nikolaevna
_2stltpush
_3(RuTPU)RU\TPU\pers\32050
701 1 _aSurzhikov
_bA. P.
_cphysicist
_cProfessor of Tomsk Polytechnic University, doctor of physical and mathematical sciences (DSc)
_f1951-
_gAnatoly Petrovich
_2stltpush
_3(RuTPU)RU\TPU\pers\30237
712 0 2 _aНациональный исследовательский Томский политехнический университет
_bИнженерная школа неразрушающего контроля и безопасности
_bОтделение контроля и диагностики
_h7978
_2stltpush
_3(RuTPU)RU\TPU\col\23584
801 2 _aRU
_b63413507
_c20191114
_gRCR
856 4 _uhttps://doi.org/10.1016/j.apsusc.2019.03.159
942 _cCF