| 000 | 03266nla2a2200541 4500 | ||
|---|---|---|---|
| 001 | 661647 | ||
| 005 | 20231030041754.0 | ||
| 035 | _a(RuTPU)RU\TPU\network\32356 | ||
| 035 | _aRU\TPU\network\31617 | ||
| 090 | _a661647 | ||
| 100 | _a20200124a2019 k y0engy50 ba | ||
| 101 | 0 | _aeng | |
| 102 | _aCH | ||
| 105 | _ay z 100zy | ||
| 135 | _adrgn ---uucaa | ||
| 181 | 0 | _ai | |
| 182 | 0 | _ab | |
| 200 | 1 |
_aFluorescent Penetrant Testing by Means of Excilamps _fA. N. Kalinichenko [et al.] |
|
| 203 |
_aText _celectronic |
||
| 300 | _aTitle screen | ||
| 330 | _aThe paper provides a brief review of modern sources of ultraviolet (UV) radiation used in fluorescent penetrant testing (FT). The differences in implementation of the method with different radiation sources (excilamps, mercury UV lamp and LED UV lamp) are revealed experimentally. It is shown that the XeCl excilamp is not inferior to other sources of UV radiation used in FT. | ||
| 333 | _aРежим доступа: по договору с организацией-держателем ресурса | ||
| 461 | 0 |
_0(RuTPU)RU\TPU\network\24092 _tMaterials Science Forum _oScientific Journal |
|
| 463 | 0 |
_0(RuTPU)RU\TPU\network\28876 _tVol. 942 : Modern Problems in Materials Processing, Manufacturing, Testing and Quality Assurance _oJanuary 2019, Tomsk, Russia _fNational Research Tomsk Polytechnic University (TPU) ; ed. A. P. Surzhikov _v[P. 141-150] _d2019 |
|
| 610 | 1 | _aэлектронный ресурс | |
| 610 | 1 | _aтруды учёных ТПУ | |
| 610 | 1 | _aexcilamp | |
| 610 | 1 | _afluorescent method | |
| 610 | 1 | _aLED UV Flashlight | |
| 610 | 1 | _apenetrant testing | |
| 610 | 1 | _atest sample | |
| 610 | 1 | _aultraviolet radiation | |
| 610 | 1 | _aUV Lamp | |
| 610 | 1 | _aэксилампы | |
| 610 | 1 | _aфлуоресцентные измерения | |
| 610 | 1 | _aсветодиодные устройства | |
| 610 | 1 | _aпенетранты | |
| 610 | 1 | _aультрафиолетовые излучения | |
| 610 | 1 | _aУФ-свет | |
| 701 | 1 |
_aKalinichenko _bA. N. _cspecialist in the field of descriptive geometry _cAssociate Professor of Tomsk Polytechnic University, Candidate of technical sciences _f1981- _gAleksey Nikolaevich _2stltpush _3(RuTPU)RU\TPU\pers\31018 |
|
| 701 | 1 |
_aSosnin _bE. A. _gEduard Anatoljevich |
|
| 701 | 1 |
_aAvdeev _bS. M. _gSergey Mikhaylovich |
|
| 701 | 1 |
_aKalinichenko _bN. P. _cspecialist in the field of non-destructive testing _cAssociate Professor of Tomsk Polytechnic University, Candidate of technical sciences _f1945- _gNikolay Petrovich _2stltpush _3(RuTPU)RU\TPU\pers\35226 |
|
| 701 | 1 |
_aLobanova _bI. S. _cspecialist in the field of non-destructive testing _cEngineer of Tomsk Polytechnic University _f1988- _gIrina Sergeevna _2stltpush _3(RuTPU)RU\TPU\pers\36098 |
|
| 712 | 0 | 2 |
_aНациональный исследовательский Томский политехнический университет _bИнженерная школа неразрушающего контроля и безопасности _bОтделение контроля и диагностики _h7978 _2stltpush _3(RuTPU)RU\TPU\col\23584 |
| 801 | 2 |
_aRU _b63413507 _c20200124 _gRCR |
|
| 856 | 4 | _uhttps://doi.org/10.4028/www.scientific.net/MSF.942.131 | |
| 942 | _cCF | ||