000 03500nlm0a2200421 4500
001 661865
005 20231030041801.0
035 _a(RuTPU)RU\TPU\network\32894
035 _aRU\TPU\network\17273
090 _a661865
100 _a20200316d2016 k y0engy50 ba
101 0 _aeng
102 _aIT
105 _ay z 100zy
135 _adrcn ---uucaa
181 0 _ai
182 0 _ab
200 1 _aThe policapillary optics application for double diffraction line intensity increase
_fYu. M. Cherepennikov, A. S. Gogolev, D. Hampai [et al.]
203 _aText
_celectronic
300 _aTitle screen
320 _a[References: 3 tit.]
330 _aNowadays X-ray absorption spectroscopy is widely used in the X-ray structural analysis [1] and can be applied to elemental analysis of substance [2]. A special group of absorption analysis methods imply measurements of the radiation absorption coefficients at a few energy lines that allow estimating a number of investigated object characteristics. Implementation of these methods requires X-ray beams with line spectrum, which is a sum of a two or more energy line. Authors propose [3] to use combination of X-ray tube and a set of crystal monochromators, which are reflect X-ray lines with different energies in the one direction, to produce such beams. This can be used as an alternative to currently using radioactive sources. In the report possibility of use X-ray polycapillary half-lens in order to increase intensity of a couple X-ray lines produced by this scheme is considered and experimental investigation results are shown. In the experiment, X-ray tube (OxfordSeries 5000) with molybdenum anode was used as a source and set of crystals, which were silicon (100) and (111), were used to produce line spectrum. The obtained results approve the possibility to increase X-ray lines intensity to more than one order of magnitude.
463 _tCharged and Neutral Particles Channeling Phenomena
_oBook of Abstracts of the 7th International Conference, Sirmione, September 25-30, 2016
_v[P. 207]
_d2016
610 1 _aэлектронный ресурс
610 1 _aтруды учёных ТПУ
610 1 _aполикапиллярная оптика
610 1 _aдифракционные линии
701 1 _aCherepennikov
_bYu. M.
_cphysicist
_cresearch engineer of Tomsk Polytechnic University
_f1989-
_gYuriy Mihaylovich
_2stltpush
_3(RuTPU)RU\TPU\pers\31561
701 1 _aGogolev
_bA. S.
_cphysicist
_cassociate professor of Tomsk Polytechnic University
_f1983-
_gAleksey Sergeevich
_2stltpush
_3(RuTPU)RU\TPU\pers\31537
701 1 _aHampai
_bD.
_gDariush
701 1 _aMiloichikova
_bI. A.
_cphysicist
_cengineer of Tomsk Polytechnic University
_f1988-
_gIrina Alekseevna
_2stltpush
_3(RuTPU)RU\TPU\pers\35525
701 1 _aStuchebrov
_bS. G.
_cphysicist
_cAssociate Professor of Tomsk Polytechnic University, Candidate of Sciences
_f1981-
_gSergey Gennadevich
_2stltpush
_3(RuTPU)RU\TPU\pers\31559
701 1 _aDabagov
_bS. B.
_gSultan Barasbievich
712 0 2 _aНациональный исследовательский Томский политехнический университет (ТПУ)
_bФизико-технический институт (ФТИ)
_bКафедра прикладной физики (№ 12) (ПФ)
_h46
_2stltpush
_3(RuTPU)RU\TPU\col\18729
801 1 _aRU
_b63413507
_c20141010
801 2 _aRU
_b63413507
_c20200316
_gRCR
856 4 _uhttps://agenda.infn.it/event/10663/contributions/4770/
942 _cCF