000 | 03500nlm0a2200421 4500 | ||
---|---|---|---|
001 | 661865 | ||
005 | 20231030041801.0 | ||
035 | _a(RuTPU)RU\TPU\network\32894 | ||
035 | _aRU\TPU\network\17273 | ||
090 | _a661865 | ||
100 | _a20200316d2016 k y0engy50 ba | ||
101 | 0 | _aeng | |
102 | _aIT | ||
105 | _ay z 100zy | ||
135 | _adrcn ---uucaa | ||
181 | 0 | _ai | |
182 | 0 | _ab | |
200 | 1 |
_aThe policapillary optics application for double diffraction line intensity increase _fYu. M. Cherepennikov, A. S. Gogolev, D. Hampai [et al.] |
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203 |
_aText _celectronic |
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300 | _aTitle screen | ||
320 | _a[References: 3 tit.] | ||
330 | _aNowadays X-ray absorption spectroscopy is widely used in the X-ray structural analysis [1] and can be applied to elemental analysis of substance [2]. A special group of absorption analysis methods imply measurements of the radiation absorption coefficients at a few energy lines that allow estimating a number of investigated object characteristics. Implementation of these methods requires X-ray beams with line spectrum, which is a sum of a two or more energy line. Authors propose [3] to use combination of X-ray tube and a set of crystal monochromators, which are reflect X-ray lines with different energies in the one direction, to produce such beams. This can be used as an alternative to currently using radioactive sources. In the report possibility of use X-ray polycapillary half-lens in order to increase intensity of a couple X-ray lines produced by this scheme is considered and experimental investigation results are shown. In the experiment, X-ray tube (OxfordSeries 5000) with molybdenum anode was used as a source and set of crystals, which were silicon (100) and (111), were used to produce line spectrum. The obtained results approve the possibility to increase X-ray lines intensity to more than one order of magnitude. | ||
463 |
_tCharged and Neutral Particles Channeling Phenomena _oBook of Abstracts of the 7th International Conference, Sirmione, September 25-30, 2016 _v[P. 207] _d2016 |
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610 | 1 | _aэлектронный ресурс | |
610 | 1 | _aтруды учёных ТПУ | |
610 | 1 | _aполикапиллярная оптика | |
610 | 1 | _aдифракционные линии | |
701 | 1 |
_aCherepennikov _bYu. M. _cphysicist _cresearch engineer of Tomsk Polytechnic University _f1989- _gYuriy Mihaylovich _2stltpush _3(RuTPU)RU\TPU\pers\31561 |
|
701 | 1 |
_aGogolev _bA. S. _cphysicist _cassociate professor of Tomsk Polytechnic University _f1983- _gAleksey Sergeevich _2stltpush _3(RuTPU)RU\TPU\pers\31537 |
|
701 | 1 |
_aHampai _bD. _gDariush |
|
701 | 1 |
_aMiloichikova _bI. A. _cphysicist _cengineer of Tomsk Polytechnic University _f1988- _gIrina Alekseevna _2stltpush _3(RuTPU)RU\TPU\pers\35525 |
|
701 | 1 |
_aStuchebrov _bS. G. _cphysicist _cAssociate Professor of Tomsk Polytechnic University, Candidate of Sciences _f1981- _gSergey Gennadevich _2stltpush _3(RuTPU)RU\TPU\pers\31559 |
|
701 | 1 |
_aDabagov _bS. B. _gSultan Barasbievich |
|
712 | 0 | 2 |
_aНациональный исследовательский Томский политехнический университет (ТПУ) _bФизико-технический институт (ФТИ) _bКафедра прикладной физики (№ 12) (ПФ) _h46 _2stltpush _3(RuTPU)RU\TPU\col\18729 |
801 | 1 |
_aRU _b63413507 _c20141010 |
|
801 | 2 |
_aRU _b63413507 _c20200316 _gRCR |
|
856 | 4 | _uhttps://agenda.infn.it/event/10663/contributions/4770/ | |
942 | _cCF |