000 | 03642nlm1a2200517 4500 | ||
---|---|---|---|
001 | 662246 | ||
005 | 20231030041814.0 | ||
035 | _a(RuTPU)RU\TPU\network\33383 | ||
090 | _a662246 | ||
100 | _a20200618a2020 k y0engy50 ba | ||
101 | 0 | _aeng | |
102 | _aUS | ||
135 | _adrcn ---uucaa | ||
181 | 0 | _ai | |
182 | 0 | _ab | |
200 | 1 |
_aCalculating Parameters of Pinhole in Collimation System of Albedo Computed Tomography of Steel Products _fE. E. Zhuravsky, B. I. Kapranov, D. S. Belkin [et al.] |
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203 |
_aText _celectronic |
||
300 | _aTitle screen | ||
320 | _a[References: 12 tit.] | ||
330 | _aWe examine specific features of the collimation system of a tomograph for testing steel products based on Compton backscattering. The device is described and the parameters of the primary pinhole collimator of the collimation system are calculated. The device allows reliable scanning of a steel test object by simply displacing the pinhole perpendicular to the X-ray axis from the tube anode within 50 mm with a focal length of 163 mm. | ||
333 | _aРежим доступа: по договору с организацией-держателем ресурса | ||
461 | _tRussian Journal of Nondestructive Testing | ||
463 |
_tVol. 56, iss. 2 _v[P. 171-178] _d2020 |
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610 | 1 | _aэлектронный ресурс | |
610 | 1 | _aтруды учёных ТПУ | |
610 | 1 | _acompton tomography | |
610 | 1 | _acollimation system | |
610 | 1 | _apinhole | |
610 | 1 | _anondestructive testing | |
610 | 1 | _aradiation testing | |
610 | 1 | _ainstrument making | |
610 | 1 | _aкомпьютерная томография | |
610 | 1 | _aколлимационные системы | |
610 | 1 | _aнеразрушающий контроль | |
610 | 1 | _aрадиационные испытания | |
610 | 1 | _aдефектоскопия | |
701 | 1 |
_aZhuravsky _bE. E. _gEvgeny Evgenjevich |
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701 | 1 |
_aKapranov _bB. I. _cRussian scientist in the field of physical methods and devices of quality control _cProfessor of Tomsk Polytechnic University, doctor of technical Sciences _f1941- _gBoris Ivanovich _2stltpush _3(RuTPU)RU\TPU\pers\35018 |
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701 | 1 |
_aBelkin _bD. S. _cspecialist in the field of nondestructive testing _cDirector of the Regional center certification, control and diagnostics of Tomsk Polytechnic University, assistant _f1986- _gDenis Sergeevich _2stltpush _3(RuTPU)RU\TPU\pers\35017 |
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701 | 1 |
_aChakhlov _bS. V. _cphysicist _cHead of the laboratory of Tomsk Polytechnic University, Candidate of physical and mathematical sciences _f1956- _gSergey Vladimirovich _2stltpush _3(RuTPU)RU\TPU\pers\34254 |
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701 | 1 |
_aShtein _bA. M. _cphysicist _cengineer of Tomsk Polytechnic University _f1986- _gAleksandr Mikhailovich _2stltpush _3(RuTPU)RU\TPU\pers\34573 |
|
712 | 0 | 2 |
_aНациональный исследовательский Томский политехнический университет _bИнститут неразрушающего контроля _bРоссийско-китайская научная лаборатория радиационного контроля и досмотра _h7433 _2stltpush _3(RuTPU)RU\TPU\col\21551 |
712 | 0 | 2 |
_aНациональный исследовательский Томский политехнический университет _bИнженерная школа неразрушающего контроля и безопасности _bОтделение контроля и диагностики _h7978 _2stltpush _3(RuTPU)RU\TPU\col\23584 |
801 | 2 |
_aRU _b63413507 _c20200618 _gRCR |
|
856 | 4 | _uhttps://doi.org/10.1134/S1061830920020102 | |
942 | _cCF |