000 | 02710nlm1a2200469 4500 | ||
---|---|---|---|
001 | 662282 | ||
005 | 20231030041816.0 | ||
035 | _a(RuTPU)RU\TPU\network\33419 | ||
035 | _aRU\TPU\network\29914 | ||
090 | _a662282 | ||
100 | _a20200707a2020 k y0engy50 ba | ||
101 | 0 | _aeng | |
102 | _aUS | ||
135 | _adrcn ---uucaa | ||
181 | 0 | _ai | |
182 | 0 | _ab | |
200 | 1 |
_aControl of Quality of Applying Heat-Conducting Compound _fA. A. Soldatov, A. A. Dementjev, A. I. Soldatov, I. M. Vasiljev |
|
203 |
_aText _celectronic |
||
300 | _aTitle screen | ||
320 | _a[References: 20 tit.] | ||
330 | _aA mathematical model is proposed for determining the quality of applying a heat-conducting compound, and simulation results are presented. The model is based on the theory of heat transfer in a solid. The model has been verified using experimental data obtained by measuring the temperature at the points of contact of two bodies using thermocouples. It is shown that the data obtained using thermocouples coincide with the data obtained using thermopower. | ||
333 | _aРежим доступа: по договору с организацией-держателем ресурса | ||
461 | _tRussian Journal of Nondestructive Testing | ||
463 |
_tVol. 56, iss. 3 _v[P. 284-290] _d2020 |
||
610 | 1 | _aэлектронный ресурс | |
610 | 1 | _aтруды учёных ТПУ | |
610 | 1 | _athermopower | |
610 | 1 | _aSeebeck effect | |
610 | 1 | _athermal resistance | |
610 | 1 | _athermal interface | |
610 | 1 | _aheat transfer | |
610 | 1 | _aэффект Зеебека | |
610 | 1 | _aтепловое сопротивление | |
610 | 1 | _aтеплопередача | |
701 | 1 |
_aSoldatov _bA. A. _cspecialist in the field of electronics _cengineer, Senior Lecturer of Tomsk Polytechnic University, candidate of technical Sciences _f1988- _gAndrey Alekseevich _2stltpush _3(RuTPU)RU\TPU\pers\35417 |
|
701 | 1 |
_aDementjev _bA. A. _gAleksandr Aleksandrovich |
|
701 | 1 |
_aSoldatov _bA. I. _cspecialist in the field of electronics _cProfessor of Tomsk Polytechnic University, doctor of technical Sciences _f1958- _gAleksey Ivanovich _2stltpush _3(RuTPU)RU\TPU\pers\31243 |
|
701 | 1 |
_aVasiljev _bI. M. _gIvan Mikhaylovich |
|
712 | 0 | 2 |
_aНациональный исследовательский Томский политехнический университет _bИнженерная школа неразрушающего контроля и безопасности _bОтделение электронной инженерии _h7977 _2stltpush _3(RuTPU)RU\TPU\col\23507 |
801 | 2 |
_aRU _b63413507 _c20200707 _gRCR |
|
856 | 4 | _uhttps://doi.org/10.1134/S1061830920030110 | |
942 | _cCF |