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035 _a(RuTPU)RU\TPU\network\33621
090 _a662466
100 _a20200820a2019 k y0engy50 ba
101 0 _aeng
_deng
102 _aNL
135 _adrcn ---uucaa
181 0 _ai
182 0 _ab
200 1 _aEffect of magnetron sputtered anode functional layer on the anode-supported solid oxide fuel cell performance
_fE. V. Chikhray [et al.]
_fA. A. Soloviev (Solovyev), A. M. Lebedinsky, A. V. Shipilova [et al.]
203 _aText
_celectronic
300 _aTitle screen
320 _a[References: 33 tit.]
330 _aNickel oxide-yttria stabilized zirconia (NiO-YSZ) thin films were reactively sputter-deposited by pulsed direct current magnetron sputtering from the Ni and ZrY targets onto heated commercial NiO-YSZ substrates. The microstructure and composition of the deposited films were investigated with regard to application as thin anode functional layers (AFLs) for solid oxide fuel cells (SOFCs). The pore size, microstructure and phase composition of both as-deposited and annealed at 1200 °C for 2 h AFLs were studied by scanning electron microscopy and X-ray diffractometry and controlled by changing the deposition process parameters. The results show that annealing in air at 1200 °C is required to improve structural homogeneity of the films. NiO-YSZ films have pores and grains of several hundred nanometers in size after reduction in hydrogen. Adhesion of deposited films was evaluated by scratch test. Anode-supported solid oxide fuel cells with the magnetron sputtered anode functional layer, YSZ electrolyte and La0.6Sr0.4Co0.2Fe0.8O3/Ce0.9Gd0.1O2 (LSCF/CGO) cathode were fabricated and tested. Influence of thin anode functional layer on performance of anode-supported SOFCs was studied. It was shown that electrochemical properties of the single fuel cells depend on the NiO volume content in the NiO-YSZ anode functional layer. Microstructural changes of NiO-YSZ layers after nickel reduction-oxidation (redox) cycling were studied. After nine redox cycles at 750 °C in partial oxidation conditions, the cell with the anode NiO-YSZ layer showed stable open circuit voltage values with the power density decrease by 11% only.
333 _aРежим доступа: по договору с организацией-держателем ресурса
461 _tInternational Journal of Hydrogen Energy
463 _tVol. 44, iss. 58
_v[P. 30636-30643]
_d2019
610 1 _aэлектронный ресурс
610 1 _aтруды учёных ТПУ
610 1 _asolid oxide fuel cells
610 1 _amagnetron sputtering
610 1 _athin-film anode
610 1 _amicrostructure
610 1 _aredox cycling
610 1 _aтвердооксидные элементы
610 1 _aмагнетронное распыление
610 1 _aтонкопленочные покрытия
610 1 _aмикроструктура
610 1 _aокислительно-восстановительные процессы
701 1 _aSoloviev (Solovyev)
_bA. A.
_cspecialist in the field of hydrogen energy
_cAssociate Professor of Tomsk Polytechnic University, Candidate of technical sciences
_f1977-
_gAndrey Aleksandrovich
_2stltpush
_3(RuTPU)RU\TPU\pers\30863
701 1 _aLebedinsky
_bA. M.
_celectrophysicist
_cAssociate Scientist of Tomsk Polytechnic University, candidate of physico-mathematical Sciences
_f1982-
_gAleksey Mikhaylovich
_2stltpush
_3(RuTPU)RU\TPU\pers\36499
701 1 _aShipilova
_bA. V.
_cspecialist in the field of hydrogen energy
_cResearcher of Tomsk Polytechnic University
_f1982-
_gAnna Viktorovna
_2stltpush
_3(RuTPU)RU\TPU\pers\35578
701 1 _aIonov
_bI. V.
_cspecialist in the field of hydrogen energy
_cEngineer of Tomsk Polytechnic University
_f1988-
_gIgor Vyacheslavovich
_2stltpush
_3(RuTPU)RU\TPU\pers\35575
701 1 _aSmolyanskiy (Smolyansky, Smolyanskii)
_bE. A.
_cPhysicist
_cResearch Engineer of Tomsk Polytechnic University
_f1985-
_gEgor Aleksandrovich
_2stltpush
_3(RuTPU)RU\TPU\pers\37673
701 1 _aLauk
_bA. L.
_cPhysicist
_cLeading engineer of Tomsk Polytechnic University
_f1957-
_gAleksandr Lukyanovich
_2stltpush
_3(RuTPU)RU\TPU\pers\37675
701 1 _aRemnev
_bG. E.
_cphysicist
_cProfessor of Tomsk Polytechnic University, Doctor of technical sciences
_f1948-
_gGennady Efimovich
_2stltpush
_3(RuTPU)RU\TPU\pers\31500
712 0 2 _aНациональный исследовательский Томский политехнический университет
_bИсследовательская школа физики высокоэнергетических процессов
_c(2017- )
_h8118
_2stltpush
_3(RuTPU)RU\TPU\col\23551
712 0 2 _aНациональный исследовательский Томский политехнический университет
_bИнженерная школа ядерных технологий
_bНаучно-образовательный центр Б. П. Вейнберга
_h7866
_2stltpush
_3(RuTPU)RU\TPU\col\23561
801 2 _aRU
_b63413507
_c20200820
_gRCR
856 4 _uhttps://doi.org/10.1016/j.ijhydene.2018.11.193
942 _cCF