000 | 04778nlm2a2200457 4500 | ||
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001 | 662508 | ||
005 | 20231030041823.0 | ||
035 | _a(RuTPU)RU\TPU\network\33663 | ||
090 | _a662508 | ||
100 | _a20200827a2019 k y0engy50 ba | ||
101 | 0 | _aeng | |
105 | _ay z 100zy | ||
135 | _adrcn ---uucaa | ||
181 | 0 | _ai | |
182 | 0 | _ab | |
200 | 1 |
_aRobotic quality control system for the components with complex shape _fYa. A. Salchak, V. Yu. Zhvyrblya, I. O. Bolotina [et al.] |
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203 |
_aText _celectronic |
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300 | _aTitle screen | ||
320 | _a[References: 7 tit.] | ||
330 | _aThis paper represents the concept of an intelligent system for manufacturing components with the complex shape that combines automated technological operation and nondestructive testing modules. The engineering solution for development of the automated ultrasound tomography module is discussed, which is the key element for quality assessment of the components at both early and final stages of the manufacturing process. The proposed solution includes a robotic manipulator to perform scanning of products of any size and shape, as well as the use of a specialized positioning table to achieve accurate testing results. The proposed automation solution for the ultrasound tomography module is performed as a threelevel system, including development of an automated workplace for the operator, which provides interconnection between every module included in the manufacturing process. | ||
461 | 0 |
_0(RuTPU)RU\TPU\network\2008 _tIOP Conference Series: Materials Science and Engineering |
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463 |
_tVol. 516 : Cognitive Robotics _oIII International Conference, 22–24 November 2018, Tomsk, Russian Federation _o[proceedings] _v[012003, 6 p.] _d2019 |
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610 | 1 | _aэлектронный ресурс | |
610 | 1 | _aтруды учёных ТПУ | |
610 | 1 | _aультразвуковой контроль | |
610 | 1 | _aтомография | |
610 | 1 | _aавтоматизированные системы | |
701 | 1 |
_aSalchak _bYa. A. _cspecialist in the field of non-destructive testing _ctech-designer of Tomsk Polytechnic University _f1992- _gYana Alekseevna _2stltpush _3(RuTPU)RU\TPU\pers\34520 |
|
701 | 1 |
_aZhvyrblya _bV. Yu. _cspecialist in the field of non-destructive testing _cengineer of Tomsk Polytechnic University _f1992- _gVadim Yurievich _2stltpush _3(RuTPU)RU\TPU\pers\36913 |
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701 | 1 |
_aBolotina _bI. O. _cspecialist in the field of industrial and medical electronics _cAssociate Professor of Tomsk Polytechnic University, Candidate of chemical sciences _f1974- _gIrina Olegovna _2stltpush _3(RuTPU)RU\TPU\pers\34516 |
|
701 | 1 |
_aLider _bA. M. _cPhysicist _cAssociate Professor of Tomsk Polytechnic University, Candidate of Physical and Mathematical Sciences (PhD) _f1976- _gAndrey Markovich _2stltpush _3(RuTPU)RU\TPU\pers\30400 |
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701 | 1 |
_aKoneva _bD. A. _cspecialist in the field of non-destructive testing _cengineer of Tomsk Polytechnic University _f1995- _gDaria Andreevna _2stltpush _3(RuTPU)RU\TPU\pers\46548 |
|
701 | 1 |
_aSednev _bD. A. _cspecialist in the field of non-destructive testing _cassistant of Tomsk Polytechnic University, Associate Scientist _f1989- _gDmitry Andreevich _2stltpush _3(RuTPU)RU\TPU\pers\34514 |
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712 | 0 | 2 |
_aНациональный исследовательский Томский политехнический университет _bИнженерная школа неразрушающего контроля и безопасности _bОтделение электронной инженерии _h7977 _2stltpush _3(RuTPU)RU\TPU\col\23507 |
712 | 0 | 2 |
_aНациональный исследовательский Томский политехнический университет _bИнженерная школа ядерных технологий _bОтделение экспериментальной физики _h7865 _2stltpush _3(RuTPU)RU\TPU\col\23549 |
712 | 0 | 2 |
_aНациональный исследовательский Томский политехнический университет _bИнженерная школа ядерных технологий _bОтделение ядерно-топливного цикла _h7864 _2stltpush _3(RuTPU)RU\TPU\col\23554 |
712 | 0 | 2 |
_aНациональный исследовательский Томский политехнический университет _bИнститут неразрушающего контроля _bМеждународная научно-образовательная лаборатория неразрушающего контроля _h6776 _2stltpush _3(RuTPU)RU\TPU\col\19961 |
801 | 2 |
_aRU _b63413507 _c20210324 _gRCR |
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856 | 4 | _uhttp://earchive.tpu.ru/handle/11683/64883 | |
856 | 4 | _uhttps://doi.org/10.1088/1757-899X/516/1/012003 | |
942 | _cCF |