000 02769nlm1a2200385 4500
001 662958
005 20231030041838.0
035 _a(RuTPU)RU\TPU\network\34126
090 _a662958
100 _a20210115a2020 k y0engy50 ba
101 0 _aeng
102 _aGB
135 _adrcn ---uucaa
181 0 _ai
182 0 _ab
200 1 _aTailoring 'photonic hook' from Janus dielectric microbar
_fYu. E. Geynts, I. V. Minin, O. V. Minin
203 _aText
_celectronic
300 _aTitle screen
320 _a[References: 30 tit.]
330 _aA new type of curved subwavelength light beam, a photonic hook (PH), emerging from the diffraction of a light wave at a mesoscale dielectric object with broken internal symmetry (Janus particle), was recently reported. For efficient and technically simpler generation of PHs, we propose a new type of asymmetric Janus microparticles, the orthogonal microbars, composed from materials with different refractive indices. Based on the numerical simulations by means of the finite elements method, we investigate the physical mechanism of PH formation by analyzing the field intensity distribution and the energy fluxes near such particles. The influence of dielectric substrate is also studied for the first time. We show that by changing the refractive index contrast between two parts of Janus bar the shape and curvature of the PHs can be efficiently controlled. The criteria of PH quality for complex characterizing the photonic hook curvature is introduced and discussed as well.
461 _tJournal of Optics
463 _tVol. 22, iss. 6
_v[065606, 8 p.]
_d2020
610 1 _aэлектронный ресурс
610 1 _aтруды учёных ТПУ
610 1 _aсветовые лучи
610 1 _aчисленное моделирование
610 1 _aпреломление
610 1 _aфотонные пучки
700 1 _aGeynts
_bYu. E.
_gYury Elmarovich
701 1 _aMinin
_bI. V.
_cphysicist
_cSenior researcher of Tomsk Polytechnic University, Doctor of technical sciences
_f1960-
_gIgor Vladilenovich
_2stltpush
_3(RuTPU)RU\TPU\pers\37571
701 1 _aMinin
_bO. V.
_cphysicist
_cprofessor of Tomsk Polytechnic University, Doctor of technical sciences
_f1960-
_gOleg Vladilenovich
_2stltpush
_3(RuTPU)RU\TPU\pers\44941
712 0 2 _aНациональный исследовательский Томский политехнический университет
_bИнженерная школа неразрушающего контроля и безопасности
_bОтделение электронной инженерии
_h7977
_2stltpush
_3(RuTPU)RU\TPU\col\23507
801 2 _aRU
_b63413507
_c20210115
_gRCR
856 4 _uhttps://doi.org/10.1088/2040-8986/ab8e9e
942 _cCF