| 000 | 03189nlm0a2200529 4500 | ||
|---|---|---|---|
| 001 | 663302 | ||
| 005 | 20231030041850.0 | ||
| 035 | _a(RuTPU)RU\TPU\network\34471 | ||
| 035 | _aRU\TPU\network\31565 | ||
| 090 | _a663302 | ||
| 100 | _a20210205a2020 k y0engy50 ba | ||
| 101 | 0 | _aeng | |
| 105 | _aa z 101zy | ||
| 135 | _adrcn ---uucaa | ||
| 181 | 0 | _ai | |
| 182 | 0 | _ab | |
| 200 | 1 |
_aAlgorithm for Assessing the Quality Compensation of the Skin-electrode Contact by Capacitive ECG Sensors _fA. I. Morenets (Morenetz), B. N. Pavlenko, I. A. Lezhnina [et al.] |
|
| 203 |
_aText _celectronic |
||
| 300 | _aTitle screen | ||
| 320 | _a[References: 11 tit.] | ||
| 330 | _aThe article presents the results of the development of algorithms and programs for assessing the quality of ECG signals obtained using capacitive electrodes. The developed program allows you to evaluate the quality of compensation of violations of the skin-electrode contact. The program includes filtering the received signals and correlation comparison of the corrected signals with the signal received in the absence of contact disturbance. | ||
| 333 | _aРежим доступа: по договору с организацией-держателем ресурса | ||
| 461 | _tElectron Devices and Materials (EDM), Annual Siberian Russian Workshop | ||
| 463 |
_tMicro/Nanotechnologies and Electron Devices (EDM) _o21th International Conference of Young Specialists, 29 June-3 July 2020, Chemal, Erlagol (Altai Republic), Russia _v[P. 418-422] _d2020 |
||
| 610 | 1 | _aэлектронный ресурс | |
| 610 | 1 | _aтруды учёных ТПУ | |
| 610 | 1 | _aportable cardiograph | |
| 610 | 1 | _acorrelation | |
| 610 | 1 | _aECG | |
| 610 | 1 | _acapacitive electrode | |
| 610 | 1 | _acardiology | |
| 610 | 1 | _aischemia | |
| 610 | 1 | _aarrhythmia | |
| 610 | 1 | _aкардиография | |
| 610 | 1 | _aкорреляции | |
| 610 | 1 | _aЭКГ | |
| 610 | 1 | _aишемия | |
| 610 | 1 | _aаритмия | |
| 701 | 1 |
_aMorenets (Morenetz) _bA. I. _cspecialist in the field of electronics _cengineer of Tomsk Polytechnic University _f1997- _gArtem Igorevich _2stltpush _3(RuTPU)RU\TPU\pers\46748 |
|
| 701 | 1 |
_aPavlenko _bB. N. _gBoris Nikolaevich |
|
| 701 | 1 |
_aLezhnina _bI. A. _cspecialist in the field of non-destructive testing _cAssociate Professor of Tomsk Polytechnic University, Candidate of technical sciences _f1984- _gInna Alekseevna _2stltpush _3(RuTPU)RU\TPU\pers\33635 |
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| 701 | 1 |
_aBoyakhchyan _bA. A. _gArman Arturovich |
|
| 701 | 1 |
_aEvtushenko _bG. S. _cDoctor of Technical Sciences, Professor of Tomsk Polytechnic University (TPU) _cRussian specialist in electrophysics _f1947- _gGennady Sergeevich _2stltpush _3(RuTPU)RU\TPU\pers\29009 |
|
| 712 | 0 | 2 |
_aНациональный исследовательский Томский политехнический университет _bИнженерная школа неразрушающего контроля и безопасности _bОтделение электронной инженерии _h7977 _2stltpush _3(RuTPU)RU\TPU\col\23507 |
| 801 | 2 |
_aRU _b63413507 _c20210205 _gRCR |
|
| 856 | 4 | 0 | _uhttps://doi.org/10.1109/EDM49804.2020.9153546 |
| 942 | _cCF | ||