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090 _a663724
100 _a20210302a2020 k y0engy50 ba
101 0 _aeng
102 _aUS
135 _adrcn ---uucaa
181 0 _ai
182 0 _ab
200 1 _aPlasmonic nanojet: an experimental demonstration
_fI. V. Minin, O. V. Minin, I. A. Glinsky [et al.]
203 _aText
_celectronic
300 _aTitle screen
320 _a[References: 32 tit.]
330 _aWe propose and study a microstructure based on a dielectric cuboid placed on a thin metal film that can act as an efficient plasmonic lens allowing the focusing of surface plasmons at the subwavelength scale. Using numerical simulations of surface plasmon polariton (SPP) field intensity distributions, we observe high-intensity subwavelength spots and formation of the plasmonic nanojet (PJ) at the telecommunication wavelength of 1530 nm. The fabricated microstructure was characterized using amplitude and phase-resolved scattering-type scanning near-field optical microscopy. We show the first experimental observation of the PJ effect for the SPP waves. Such a novel, to the best of our knowledge, and simple platform can provide new pathways for plasmonics, high-resolution imaging, and biophotonics, as well as optical data storage.
333 _aРежим доступа: по договору с организацией-держателем ресурса
461 _tOptics Letters
463 _tVol. 45, iss. 12
_v[P. 3244-3247]
_d2020
610 1 _aэлектронный ресурс
610 1 _aтруды учёных ТПУ
701 1 _aMinin
_bI. V.
_cphysicist
_cSenior researcher of Tomsk Polytechnic University, Doctor of technical sciences
_f1960-
_gIgor Vladilenovich
_2stltpush
_3(RuTPU)RU\TPU\pers\37571
701 1 _aMinin
_bO. V.
_cphysicist
_cprofessor of Tomsk Polytechnic University, Doctor of technical sciences
_f1960-
_gOleg Vladilenovich
_2stltpush
_3(RuTPU)RU\TPU\pers\44941
701 1 _aGlinsky
_bI. A.
_gIgor Andreevich
701 1 _aKhabibullin
_bR. A.
_gRustam Anvarovich
701 1 _aMalureanu
_bR.
_gRadu
701 1 _aLavrinenko
_bA. V.
_gAndrey Vladimirovich
701 1 _aYakubovsky
_bD. I.
_gDmitry Igorevich
701 1 _aArsenin
_bA. V.
_gAleksey Vladimirovich
701 1 _aVolkov
_bV. S.
_gValentin Sergeevich
701 1 _aPonomarev
_bD. S.
712 0 2 _aНациональный исследовательский Томский политехнический университет
_bИнженерная школа неразрушающего контроля и безопасности
_bОтделение электронной инженерии
_h7977
_2stltpush
_3(RuTPU)RU\TPU\col\23507
801 2 _aRU
_b63413507
_c20210302
_gRCR
856 4 _uhttps://doi.org/10.1364/OL.391861
942 _cCF