| 000 | 03004nlm1a2200505 4500 | ||
|---|---|---|---|
| 001 | 664134 | ||
| 005 | 20231030041919.0 | ||
| 035 | _a(RuTPU)RU\TPU\network\35318 | ||
| 035 | _aRU\TPU\network\35275 | ||
| 090 | _a664134 | ||
| 100 | _a20210329a2020 k y0engy50 ba | ||
| 101 | 0 | _aeng | |
| 102 | _aKZ | ||
| 135 | _adrcn ---uucaa | ||
| 181 | 0 | _ai | |
| 182 | 0 | _ab | |
| 200 | 1 |
_aCalculation of structural parameters and design of a protective shield for an X-ray system _fI. V. Plotnikova, L. A. Redko, S. S. Baus [et al.] |
|
| 203 |
_aText _celectronic |
||
| 300 | _aTitle screen | ||
| 320 | _a[References: 28 tit.] | ||
| 330 | _aThe need to calculate the radiation protection of the radiation system is the basis in which diagnostic, design or assembly activities are carried out as part of non-destructive testing. The paper provides an analysis of the design features of x-ray systems and their technical characteristics, operating conditions, diagnostic capabilities of modern tomographic systems. The dependences of the distribution of X-ray radiation and voltage on the thickness of the protective screen are given. The calculation of the thickness of the protective screen is presented, which will allow you to design the body of the protective screen of the x-ray system. The above studies will facilitate the work of specialists in the development of new modifications of x-ray systems. | ||
| 461 | _tEurasian Physical Technical Journal | ||
| 463 |
_tVol. 17, No. 1 (33) _v[P. 138-144] _d2020 |
||
| 610 | 1 | _aэлектронный ресурс | |
| 610 | 1 | _aтруды учёных ТПУ | |
| 610 | 1 | _amodel | |
| 610 | 1 | _acontrol | |
| 610 | 1 | _adesign | |
| 610 | 1 | _ax-ray radiation | |
| 610 | 1 | _acharacteristic | |
| 610 | 1 | _aмодели | |
| 610 | 1 | _aконтроль | |
| 610 | 1 | _aдизайн | |
| 610 | 1 | _aрентгеновское излучение | |
| 610 | 1 | _aхарактеристики | |
| 701 | 1 |
_aPlotnikova _bI. V. _cspecialist in the field of quality _cAssociate Professor of the Tomsk Polytechnic University, Candidate of technical sciences _f1965- _gInna Vasilievna _2stltpush _3(RuTPU)RU\TPU\pers\33604 |
|
| 701 | 1 |
_aRedko _bL. A. _cspecialist in the field of quality _cAssociate Professor of the Tomsk Polytechnic University, Candidate of technical sciences _f1978- _gLyudmila Anatolevna _2stltpush _3(RuTPU)RU\TPU\pers\32405 |
|
| 701 | 1 |
_aBaus _bS. S. _gStanislav Sergeevich |
|
| 701 | 1 |
_aKassymov _bS. S. |
|
| 701 | 1 |
_aBaltabekov _bA. S. |
|
| 712 | 0 | 2 |
_aНациональный исследовательский Томский политехнический университет _bИнженерная школа неразрушающего контроля и безопасности _bОтделение контроля и диагностики _h7978 _2stltpush _3(RuTPU)RU\TPU\col\23584 |
| 801 | 2 |
_aRU _b63413507 _c20210514 _gRCR |
|
| 856 | 4 | _uhttp://earchive.tpu.ru/handle/11683/65334 | |
| 856 | 4 | _uhttps://doi.org/10.31489/2020No1/138-144 | |
| 942 | _cCF | ||