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001 | 664313 | ||
005 | 20231030041925.0 | ||
035 | _a(RuTPU)RU\TPU\network\35497 | ||
090 | _a664313 | ||
100 | _a20210408a2019 k y0engy50 ba | ||
101 | 0 | _aeng | |
135 | _adrcn ---uucaa | ||
181 | 0 | _ai | |
182 | 0 | _ab | |
200 | 1 |
_aEffect of fast cooling on defects level, microstructure and magnetic properties of LiTiZn ferrite ceramics _fA. V. Malyshev, A. B. Petrova, A. N. Sokolovsky, A. P. Surzhikov |
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203 |
_aText _celectronic |
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300 | _aTitle screen | ||
320 | _a[References: 32 tit.] | ||
330 | _aMethod for defects level estimating by the analysis of temperature dependences of initial permeability was applied to LiTiZn ferrite ceramics. It was shown that samples of ferrite ceramics sintered in the fast cooling regime have higher defects level compare to slow cooling regime. This result confirmed by XRD. The method has a higher sensitivity compare to typical X-ray methods. The average grain sizes for both types of samples were similar. Besides they are highly agglomerated and show large grain size dispersion and also pores. Such microstructures also explain the decreased saturation magnetization for fast-cooled samples. The Cure point differs by about 20° for these sample types due to non-stoichiometry on oxygen. The obtained results can be used on industrial products of soft ferrite ceramics for defects monitoring. | ||
333 | _aРежим доступа: по договору с организацией-держателем ресурса | ||
461 | _tMaterials Chemistry and Physics | ||
463 |
_tVol. 227 _v[P. 219-223] _d2019 |
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610 | 1 | _aэлектронный ресурс | |
610 | 1 | _aтруды учёных ТПУ | |
610 | 1 | _aLiTiZn ferrites | |
610 | 1 | _ainitial permeability | |
610 | 1 | _acure point | |
610 | 1 | _adefects level | |
610 | 1 | _aферриты | |
610 | 1 | _aпроницаемость | |
701 | 1 |
_aMalyshev _bA. V. _cSpecialist in the field of electrical engineering _cSenior researcher at Tomsk Polytechnic University, Candidate of Physics and Mathematics (PhD Phys.-Math.) _f1978- _gAndrei Vladimirovich _2stltpush _3(RuTPU)RU\TPU\pers\30965 |
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701 | 1 |
_aPetrova _bA. B. _cspecialist in the field of non-destructive testing _cAssociate Scientist of Tomsk Polytechnic University _f1992- _gAnna Borisovna _2stltpush _3(RuTPU)RU\TPU\pers\36438 |
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701 | 1 |
_aSokolovsky _bA. N. _gAleksey Nikolaevich |
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701 | 1 |
_aSurzhikov _bA. P. _cphysicist _cProfessor of Tomsk Polytechnic University, doctor of physical and mathematical sciences (DSc) _f1951- _gAnatoly Petrovich _2stltpush _3(RuTPU)RU\TPU\pers\30237 |
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712 | 0 | 2 |
_aНациональный исследовательский Томский политехнический университет _bИнститут неразрушающего контроля _bПроблемная научно-исследовательская лаборатория электроники, диэлектриков и полупроводников _h194 _2stltpush _3(RuTPU)RU\TPU\col\19033 |
801 | 2 |
_aRU _b63413507 _c20210408 _gRCR |
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856 | 4 | _uhttps://doi.org/10.1016/j.matchemphys.2019.02.022 | |
942 | _cCF |