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100 _a20210408a2019 k y0engy50 ba
101 0 _aeng
102 _aUS
135 _adrcn ---uucaa
181 0 _ai
182 0 _ab
200 1 _aApodization-Assisted Subdiffraction Near-Field Localization in 2D Phase Diffraction Grating
_fYu. E. Geynts, O. V. Minin, I. V. Minin
203 _aText
_celectronic
300 _aTitle screen
320 _a[References: 25 tit.]
330 _aConventional phase diffraction gratings can be used to localize the incoming optical radiation in the near‐field region. A new design of the binary phase diffraction grating is proposed with embedded pupil opaque mask inside each stripe. By means of numerical simulations, it is shown that with this masked phase grating the spatial resolution of the near-field localization can be substantially improved and brought even beyond the solid immersion limit ([lambda]/2n). Moreover, due to anomalous apodization effect, the subdiffraction field localization is accompanied by intensity enhancement as compared to the non-masked design. The pupil mask rearranges the optical fluxes within the stripes and promotes the Fano resonances excitation in the periodic step lattice. This can be important for advancing the phase grating-based super-resolution technologies, including subdiffraction imaging, interferometry, and surface fabrication.
333 _aРежим доступа: по договору с организацией-держателем ресурса
461 _tAnnalen der Physik
463 _tVol. 531, iss. 7
_v[1900033, 5 p.]
_d2019
610 1 _aэлектронный ресурс
610 1 _aтруды учёных ТПУ
610 1 _aanomalous apodization
610 1 _abinary diffraction grating
610 1 _aFano resonance
610 1 _afocusing superresolution
610 1 _apupil mask
610 1 _aаподизация
610 1 _aдифракционные решетки
610 1 _aсверхразрешение
700 1 _aGeynts
_bYu. E.
_gYury Elmarovich
701 1 _aMinin
_bO. V.
_cphysicist
_cprofessor of Tomsk Polytechnic University, Doctor of technical sciences
_f1960-
_gOleg Vladilenovich
_2stltpush
_3(RuTPU)RU\TPU\pers\44941
701 1 _aMinin
_bI. V.
_cphysicist
_cProfessor of Tomsk Polytechnic University, Doctor of technical sciences
_f1960-
_gIgor Vladilenovich
_2stltpush
_3(RuTPU)RU\TPU\pers\37571
712 0 2 _aНациональный исследовательский Томский политехнический университет
_bИнженерная школа неразрушающего контроля и безопасности
_bОтделение электронной инженерии
_h7977
_2stltpush
_3(RuTPU)RU\TPU\col\23507
801 2 _aRU
_b63413507
_c20210408
_gRCR
856 4 _uhttps://doi.org/10.1002/andp.201900033
942 _cCF