| 000 | 04116nlm2a2200421 4500 | ||
|---|---|---|---|
| 001 | 664807 | ||
| 005 | 20231030041942.0 | ||
| 035 | _a(RuTPU)RU\TPU\network\35992 | ||
| 035 | _aRU\TPU\network\35786 | ||
| 090 | _a664807 | ||
| 100 | _a20210519a2020 k y0engy50 ba | ||
| 101 | 0 | _aeng | |
| 105 | _ay z 100zy | ||
| 135 | _adrcn ---uucaa | ||
| 181 | 0 | _ai | |
| 182 | 0 | _ab | |
| 200 | 1 |
_aAcoustic-electric non-destructive method to detect defects in dielectric materials _fA. A. Bespalko (Bespal'ko), A. P. Surzhikov, D. D. Dann [et al.] |
|
| 203 |
_aText _celectronic |
||
| 300 | _aTitle screen | ||
| 320 | _a[References: 22 tit.] | ||
| 330 | _aThe paper reveals the effect of imperfection of solid-state dielectric samples on the parameters of the electromagnetic response under exposure of the test object to deterministic acoustic impact. The patterns of changes in the parameters of electromagnetic signals with variations and an increased electric field vector with respect to the defect–sample contact are provided. It is shown that the amplitude-frequency parameters of the emitted electromagnetic signals are directly related to the acoustic impedance and conductivity of the contacting medium and defect. The amplitudes of the electromagnetic responses are found to correspond to the distribution of mechanical stresses arising in an imperfect system during acoustic pulse propagation in time and space determined through mathematical modeling. The paper presents data on changes in the electromagnetic signal parameters for model defects of an increased size in samples of similar type. | ||
| 461 | 0 |
_0(RuTPU)RU\TPU\network\3526 _tJournal of Physics: Conference Series |
|
| 463 |
_tVol. 1636 : Transformation of Non-Destructive Testing and Technical Diagnostics in the Era of Digitalization. Society Security in a Changing World _oThe XXII Russian National Conference on Non-Destructive Testing and Technical Diagnostics, 3-5 March 2020, Moscow, Russian Federation _v[012026, 8 p.] _d2020 |
||
| 610 | 1 | _aэлектронный ресурс | |
| 610 | 1 | _aтруды учёных ТПУ | |
| 610 | 1 | _aэлектрический отклик | |
| 610 | 1 | _aпараметры | |
| 610 | 1 | _aтехнические характеристики | |
| 701 | 1 |
_aBespalko (Bespal'ko) _bA. A. _cphysicist _cLeading researcher of Tomsk Polytechnic University, Candidate of physical and mathematical sciences _f1948- _gAnatoly Alekseevich _2stltpush _3(RuTPU)RU\TPU\pers\32243 |
|
| 701 | 1 |
_aSurzhikov _bA. P. _cphysicist _cProfessor of Tomsk Polytechnic University, doctor of physical and mathematical sciences (DSc) _f1951- _gAnatoly Petrovich _2stltpush _3(RuTPU)RU\TPU\pers\30237 |
|
| 701 | 1 |
_aDann _bD. D. _cspecialist in the field of electrical engineering _cEngineer-researcher of Tomsk Polytechnic University _f1987- _gDenis Dmitrievich _2stltpush _3(RuTPU)RU\TPU\pers\32192 |
|
| 701 | 1 |
_aPomishin _bE. K. _cphysicist _ctechnician of Tomsk Polytechnic University _f1993- _gEvgeny Karlovich _2stltpush _3(RuTPU)RU\TPU\pers\36440 |
|
| 701 | 1 |
_aPetrov _bM. V. _cspecialist in the field of non-destructive testing _cAssociate Scientist of Tomsk Polytechnic University _f1992- _gMaksim Vyacheslavovich _2stltpush _3(RuTPU)RU\TPU\pers\36439 |
|
| 712 | 0 | 2 |
_aНациональный исследовательский Томский политехнический университет _bИнститут неразрушающего контроля _bПроблемная научно-исследовательская лаборатория электроники, диэлектриков и полупроводников _h194 _2stltpush _3(RuTPU)RU\TPU\col\19033 |
| 712 | 0 | 2 |
_aНациональный исследовательский Томский политехнический университет _bИнженерная школа неразрушающего контроля и безопасности _bОтделение контроля и диагностики _h7978 _2stltpush _3(RuTPU)RU\TPU\col\23584 |
| 801 | 2 |
_aRU _b63413507 _c20210519 _gRCR |
|
| 856 | 4 | _uhttps://doi.org/10.1088/1742-6596/1636/1/012026 | |
| 942 | _cCF | ||