000			02250nlm1a2200409 4500
001			665000
005			20231030041948.0
035			_a(RuTPU)RU\TPU\network\36199
090			_a665000
100			_a20210621a2020 k y0engy50 ba
101	0		_aeng
102			_aPL
135			_adrcn ---uucaa
181		0	_ai
182		0	_ab
200	1		_aAblation of single-crystalline cesium iodide by extreme ultraviolet capillary-discharge laser _fJ. Wild, P. Pira, T. Burian [et al.]
203			_aText _celectronic
300			_aTitle screen
320			_a[References: 23 tit.]
330			_aExtreme ultraviolet (XUV) capillary-discharge lasers (CDLs) are a suitable source for the effi cient, clean ablation of ionic crystals, which are obviously diffi cult to ablate with conventional, long-wavelength lasers. In the present study, a single crystal of cesium iodide (CsI) was irradiated by multiple, focused 1.5-ns pulses of 46.9-nm radiation delivered from a compact XUV-CDL device operated at either 2-Hz or 3-Hz repetition rates. The ablation rates were determined from the depth of the craters produced by the accumulation of laser pulses. Langmuir probes were used to diagnose the plasma plume produced by the focused XUV-CDL beam. Both the electron density and electron temperature were suffi ciently high to confi rm that ablation was the key process in the observed CsI removal. Moreover, a CsI thin fi lm on MgO substrate was prepared by XUV pulsed laser deposition; a fraction of the fi lm was detected by X-ray photoelectron spectroscopy.
461			_tNukleonika
463			_tVol. 65, iss. 4 _v[P. 205-210] _d2020
610	1		_aэлектронный ресурс
610	1		_aтруды учёных ТПУ
610	1		_aablation
610	1		_aCsI
610	1		_adesorption
610	1		_alaser
701		1	_aWild _bJ. _gJan
701		1	_aPira _bP. _gPeter
701		1	_aBurian _bT. _gTomas
701		1	_aVysin _bL. _gLudek
701		1	_aJuha _bL. _gLibor
701		1	_aTichy _bM. _cchemist _cProfessor of Tomsk Polytechnic University, Doctor of physical and mathematical sciences _f1947- _gMilan _2stltpush _3(RuTPU)RU\TPU\pers\35771
801		2	_aRU _b63413507 _c20210621 _gRCR
856	4		_uhttps://doi.org/10.2478/nuka-2020-0031
942			_cCF