| 000 | 03846nlm1a2200469 4500 | ||
|---|---|---|---|
| 001 | 665699 | ||
| 005 | 20231030042012.0 | ||
| 035 | _a(RuTPU)RU\TPU\network\36903 | ||
| 035 | _aRU\TPU\network\36902 | ||
| 090 | _a665699 | ||
| 100 | _a20211109a2021 k y0engy50 ba | ||
| 101 | 0 | _aeng | |
| 102 | _aNL | ||
| 135 | _adrcn ---uucaa | ||
| 181 | 0 | _ai | |
| 182 | 0 | _ab | |
| 200 | 1 |
_aSimple and robust methodology of defect thermal characterization based on thermal quadrupoles and polynomial approximation _fD. A. Nesteruk, V. P. Vavilov, A. O. Chulkov, D. Burleigh |
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| 203 |
_aText _celectronic |
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| 300 | _aTitle screen | ||
| 320 | _a[References: 25 tit.] | ||
| 330 | _aAn approach is proposed to evaluate the depth and thickness of planar defects detected by thermal nondestructive testing (TNDT) methods. A 1D 3-layer thermal problem is solved by using the technique of thermal quadrupoles, and the solution of the corresponding inverse problem is presented in the polynomial form. The inverse solution involves a number of TNDT experimental parameters, in particular, differential temperature signals, dimensionless contrasts and their observation times. The accuracy of defect characterization is in the range of 2–15% in defect depth and from 10 to 40% in defect thickness. It is believed that the proposed defect characterization approach can be easily implemented in existing TNDT systems to provide approximate values of defect parameters. | ||
| 333 | _aРежим доступа: по договору с организацией-держателем ресурса | ||
| 461 | _tNDT & E International | ||
| 463 |
_tVol. 124 _v[102522, 9 p.] _d2021 |
||
| 610 | 1 | _aэлектронный ресурс | |
| 610 | 1 | _aтруды учёных ТПУ | |
| 610 | 1 | _athermal nondestructive testing | |
| 610 | 1 | _adefect characterization | |
| 610 | 1 | _athermal quadrupoles | |
| 610 | 1 | _apolynomial fitting | |
| 610 | 1 | _aнеразрушающий контроль | |
| 610 | 1 | _aдефекты | |
| 610 | 1 | _aполиномы | |
| 701 | 1 |
_aNesteruk _bD. A. _cspecialist in the field of descriptive geometry _cAssociate Professor of Tomsk Polytechnic University, Candidate of technical sciences _f1979- _gDenis Alekseevich _2stltpush _3(RuTPU)RU\TPU\pers\31502 |
|
| 701 | 1 |
_aVavilov _bV. P. _cSpecialist in the field of dosimetry and methodology of nondestructive testing (NDT) _cDoctor of technical sciences (DSc), Professor of Tomsk Polytechnic University (TPU) _f1949- _gVladimir Platonovich _2stltpush _3(RuTPU)RU\TPU\pers\32161 |
|
| 701 | 1 |
_aChulkov _bA. O. _cspecialist in the field of non-destructive testing _cEngineer of Tomsk Polytechnic University _f1989- _gArseniy Olegovich _2stltpush _3(RuTPU)RU\TPU\pers\32220 |
|
| 701 | 1 |
_aBurleigh _bD. _gDouglas |
|
| 712 | 0 | 2 |
_aНациональный исследовательский Томский политехнический университет _bИнженерная школа неразрушающего контроля и безопасности _bЦентр промышленной томографии _bНаучно-производственная лаборатория "Бетатронная томография крупногабаритных объектов" _h7983 _2stltpush _3(RuTPU)RU\TPU\col\23717 |
| 712 | 0 | 2 |
_aНациональный исследовательский Томский политехнический университет _bИнженерная школа неразрушающего контроля и безопасности _bЦентр промышленной томографии _bНаучно-производственная лаборатория "Тепловой контроль" _h7984 _2stltpush _3(RuTPU)RU\TPU\col\23838 |
| 801 | 2 |
_aRU _b63413507 _c20211109 _gRCR |
|
| 856 | 4 | _uhttps://doi.org/10.1016/j.ndteint.2021.102522 | |
| 942 | _cCF | ||